Effects of the Si/Al layer thickness on the continuity, crystalline orientation and the growth kinetics of the poly-Si thin films formed by aluminum-induced crystallization
1999 ◽
Vol 46
(10)
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pp. 2062-2068
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2018 ◽
Vol 7
(11)
◽
pp. P615-P623
2016 ◽
Vol 12
(1)
◽
pp. 82-88
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