Influence of thickness on the structural properties of radio-frequency and direct-current magnetron sputtered TiO2 anatase thin films

2014 ◽  
Vol 558 ◽  
pp. 443-448 ◽  
Author(s):  
S.K. Mukherjee ◽  
A. Nebatti ◽  
F. Mohtascham ◽  
S. Schipporeit ◽  
C. Notthoff ◽  
...  
2012 ◽  
Vol 626 ◽  
pp. 168-172
Author(s):  
Samsiah Ahmad ◽  
Nor Diyana Md Sin ◽  
M.N. Berhan ◽  
Mohamad Rusop

Zinc Oxide (ZnO) thin films were deposited onto SiO2/Si substrates using radio frequency (RF) magnetron sputtering method as an Ammonia (NH3) sensor. The dependence of RF power (50~300 Watt) on the structural properties and sensitivity of NH3sensor were investigated. XRD analysis shows that regardless of the RF power, all samples display the preferred orientation on the (002) plane. The results show that the ZnO deposited at 200 Watt display the highest sensitivity value which is 44%.


2019 ◽  
Vol 669 ◽  
pp. 169-173 ◽  
Author(s):  
Vl. Kolkovsky ◽  
J.-U. Schmidt ◽  
S. Döring

Author(s):  
Robert Saraiva Matos ◽  
Henrique Duarte Fonseca Filho ◽  
Abhijeet Das ◽  
Sanjeev Kumar ◽  
Vipin Chawla ◽  
...  

1995 ◽  
Vol 77 (10) ◽  
pp. 5309-5313 ◽  
Author(s):  
J.‐F. Bobo ◽  
H. Chatbi ◽  
M. Vergnat ◽  
L. Hennet ◽  
O. Lenoble ◽  
...  

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