Doping transition of doped ZnO nanorods measured by Kelvin probe force microscopy

2012 ◽  
Vol 520 (14) ◽  
pp. 4622-4625 ◽  
Author(s):  
Chu Van Ben ◽  
Hak Dong Cho ◽  
Tae Won Kang ◽  
Woochul Yang
Keyword(s):  
Zno Nanorods ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Doped Zno

scholarly journals Structural and Electrical Characterization of Pure and Al-Doped ZnO Nanorods

Materials ◽  
2021 ◽  
Vol 14 (23) ◽  
pp. 7454
Author(s):  
Ivana Panžić ◽  
Ivana Capan ◽  
Tomislav Brodar ◽  
Arijeta Bafti ◽  
Vilko Mandić
Keyword(s):  
Zno Nanorods ◽  
Electrical Characterization ◽  
Electric Transport ◽  
Kelvin Probe ◽  
Al Doping ◽  
X Ray ◽  
Force Microscopy ◽  
Order Of Magnitude ◽  
Doped Zno

Pure and Al-doped (3 at.%) ZnO nanorods were prepared by two-step synthesis. In the first step, ZnO thin films were deposited on silicon wafers by spin coating; then, ZnO nanorods (NR) and Al-doped ZnO NR were grown using a chemical bath method. The structural properties of zincite nanorods were determined by X-ray diffraction (XRD) and corroborated well with the morphologic properties obtained by field-emission gun scanning electron microscopy (FEG SEM) with energy-dispersive X-ray spectroscopy (EDS). Morphology results revealed a minute change in the nanorod geometry upon doping, which was also visible by Kelvin probe force microscopy (KPFM). KPFM also showed preliminary electrical properties. Detailed electrical characterization of pure and Al-doped ZnO NR was conducted by temperature-dependent current–voltage (I–V) measurements on Au/(Al)ZnO NR/n-Si junctions. It was shown that Al doping increases the conductivity of ZnO NR by an order of magnitude. The I–V characteristics of pure and Al-doped ZnO NR followed the ohmic regime for lower voltages, whereas, for the higher voltages, significant changes in electric conduction mechanisms were detected and ascribed to Al-doping. In conclusion, for future applications, one should consider the possible influence of the geometry change of (Al)ZnO NRs on their overall electric transport properties.

Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽  
2018 ◽  
Vol 10 (2) ◽  
pp. 538-547 ◽  
Author(s):  
Hyungbeen Lee ◽  
Sang Won Lee ◽  
Gyudo Lee ◽  
Wonseok Lee ◽  
Kihwan Nam ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Powerful Method ◽  
Kelvin Probe ◽  
Single Nucleotide ◽  
Force Microscopy ◽  
Surface Potentials ◽  
Dna Mismatches ◽  
Nucleotide Resolution ◽  
Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

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