Third-order optical nonlinearity of Cu nanoparticle-dispersed Ba0.5Sr0.5TiO3 films prepared by alternating pulsed laser deposition

2006 ◽  
Vol 515 (4) ◽  
pp. 2332-2336 ◽  
Author(s):  
Ji-Suk Kim ◽  
Kyeong-Seok Lee ◽  
Sang Sub Kim
2012 ◽  
Vol 209 (5) ◽  
pp. 966-971 ◽  
Author(s):  
Guohua Yang ◽  
Junhe Han ◽  
Zhuoyu Huo ◽  
Yangzhou Nie ◽  
Yuzong Gu

2007 ◽  
Vol 61 (17) ◽  
pp. 3701-3704 ◽  
Author(s):  
Kansong Chen ◽  
Haoshuang Gu ◽  
Jiansan Zou ◽  
Wang Li ◽  
Huang Yi

1999 ◽  
Vol 75 (7) ◽  
pp. 902-904 ◽  
Author(s):  
W. F. Zhang ◽  
M. S. Zhang ◽  
Z. Yin ◽  
Y. Z. Gu ◽  
Z. L. Du ◽  
...  

2006 ◽  
Vol 6 (11) ◽  
pp. 3426-3428
Author(s):  
Ji-Suk Kim ◽  
Kyeong-Seok Lee ◽  
Sang Sub Kim

Nanocomposite thin films consisting of nanometer-sized Ag particles embedded in amorphous Ba0.5Sr0.5TiO3 matrix were prepared on fused silica substrates by an alternating pulsed laser deposition method. Their optical nonlinearities have been studied using the Z-scan method. The surface plasmon resonance (SPR) peak shifts to red and increases with the increasing the volume fraction of Ag in the nanocomposite films. The magnitude of the third-order nonlinear susceptibility of the nanocomposite with an Ag volume fraction of 3.3% was calculated to be ∼2 × 10−8 esu at the SPR wavelength.


2001 ◽  
Vol 18 (12) ◽  
pp. 1598-1600 ◽  
Author(s):  
Yang Guang ◽  
Wang Huan-Hua ◽  
Tan Guo-Tai ◽  
Jiang An-Quan ◽  
Zhou Yue-Liang ◽  
...  

2016 ◽  
Vol 60 ◽  
pp. 123-127 ◽  
Author(s):  
S.A. Mulenko ◽  
V.I. Rudenko ◽  
V.R. Liakhovetskyi ◽  
A.M. Brodin ◽  
N. Stefan

2016 ◽  
Vol 61 (6) ◽  
pp. 495-501 ◽  
Author(s):  
M.S. Brodyn ◽  
◽  
S.A. Mulenko ◽  
V.I. Rudenko ◽  
V.R. Liakhovetskyi ◽  
...  

2011 ◽  
Vol 181-182 ◽  
pp. 212-219
Author(s):  
Zhi Cheng Zhong ◽  
Shao Hua Qu ◽  
Xiang Dong Ji ◽  
Jie Bo Hu ◽  
Duan Ming Zhang

Perovskite KTa0.65Nb0.35O3 (KTN) thin films were grown by pulsed laser deposition (PLD) on single crystal SrTiO3 (100) substrates. X-ray diffraction (XRD) analyses illustrate epitaxially grown of KTN thin films along the (100) orientation. The surface morphology of films observed by atomic force microscope (AFM) showed that, the surface of films was smooth and uniform built from regular, ordered and dense grains with the root mean square (RMS) roughness of 5.602 nm. Linear and third-order nonlinear optical properties of the films were investigated by using transmission spectra as well as the Z-scan technique with femtosecond laser pulses, respectively. The open-aperture and closed-aperture Z-scan curves of KTN thin films were obtained in the first measurement. The calculated nonlinear refractive index was , the nonlinear absorption coefficient is = , and the real part and imaginary part of the third order nonlinear susceptibility are and respectively.


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