X-ray diffraction analysis of the anisotropic nature of the structural imperfections in a sputter-deposited TiO2/Ti3Al bilayer

2006 ◽  
Vol 514 (1-2) ◽  
pp. 110-119 ◽  
Author(s):  
Y.H. Zhao ◽  
U. Welzel ◽  
J. van Lier ◽  
E.J. Mittemeijer
Keyword(s):  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited ◽  
Structural Imperfections

scholarly journals Domain and lattice contributions to dielectric and piezoelectric properties of Pb(Zrx, Ti1−x)O3 thin films as a function of composition

1999 ◽  
Vol 14 (11) ◽  
pp. 4307-4318 ◽  
Author(s):  
S. Hiboux ◽  
P. Muralt ◽  
T. Maeder
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Domain Wall ◽  
Diffraction Analysis ◽  
Piezoelectric Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited ◽  
Dielectric And Piezoelectric Properties

In situ reactively sputter deposited, 300-nm-thick Pb(Zrx, Ti1−x)O3 thin films were investigated as a function of composition, texture, and different electrodes (Pt,RuO2).X-ray diffraction analysis, ferroelectric, dielectric, and piezoelectric measurements were carried out. While for dielectric properties bulklike contributions from lattice as well as from domains are observed, domain wall contributions to piezoelectric properties are very much reduced in the morphotropic phase boundary (MPB) region. Permittivity and d33 do not peak at the same composition; the MPB region is broadened up and generally shifted to the tetragonal side.

The analysis of homogeneously and inhomogeneously anisotropic microstructures by X-ray diffraction

2005 ◽  
Vol 20 (4) ◽  
pp. 376-392 ◽  
Author(s):  
Udo Welzel ◽  
Eric J. Mittemeijer
Keyword(s):  
Diffraction Analysis ◽  
Parallel Plate ◽  
X Ray Diffraction ◽  
Parallel Beam ◽  
X Ray ◽  
Structural Imperfection ◽  
Synchrotron Beam ◽  
Grain Interaction ◽  
Methodological Approaches ◽  
Sputter Deposited

The microstructure of materials is generally, macroscopically, anisotropic and/or inhomogeneous. Traditional diffraction analyses do not take into account this anisotropy and/or inhomogeneity of microstructural features. Thus obtained results can be incomplete, ambiguous, or even erroneous. In this work instrumental requirements (application of parallel beam diffractometers with X-ray lenses or X-ray mirrors and parallel-plate collimators in the laboratory and at synchrotron beam lines) and methodological approaches for the diffraction analysis of anisotropic and inhomogeneous microstructures have been discussed and have been illustrated on the basis of two experimental examples: analysis of the anisotropic nature of the structural imperfection of a sputterdeposited Ti3Al layer and analysis of the anisotropic and inhomogeneous elastic grain interaction in a sputter-deposited Ni layer.

TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

1996 ◽  
Vol 54 ◽  
pp. 1020-1021
Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Stoichiometric Composition ◽  
Analytical Electron Microscopy ◽  
Grain Structure ◽  
Solid State Reactions ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

Ten-Vertex Polyhedral Monocarbaborane Chemistry. The Novel High-Yield Formation of the Ten-Vertex closo Compound [6-(PMe2Ph)-closo-1-CB9H9] from the Thermolysis of [8,8-(PMe2Ph)2-nido-8,7-PtCB9H11]

1993 ◽  
Vol 58 (12) ◽  
pp. 2924-2935 ◽  
Author(s):  
Jane H. Jones ◽  
Bohumil Štíbr ◽  
John D. Kennedy ◽  
Mark Thornton-Pett
Keyword(s):  
Nmr Spectroscopy ◽  
Diffraction Analysis ◽  
High Yield ◽  
Monoclinic Space Group ◽  
The Novel ◽  
X Ray Diffraction ◽  
Metal Centre ◽  
X Ray ◽  
Yield Formation ◽  
Boiling Toluene

Thermolysis of [8,8-(PMe2Ph)2-nido-8,7-PtCB9H11] in boiling toluene solution results in an elimination of the platinum centre and cluster closure to give the ten-vertex closo species [6-(PMe2Ph)-closo-1-CB9H9] in 85% yield as a colourles air stable solid. The product is characterized by NMR spectroscopy and single-crystal X-ray diffraction analysis. Crystals (from hexane-dichloromethane) are monoclinic, space group P21/c, with a = 903.20(9), b = 1 481.86(11), c = 2 320.0(2) pm, β = 97.860(7)° and Z = 8, and the structure has been refined to R(Rw) = 0.045(0.051) for 3 281 observed reflections with Fo > 2.0σ(Fo). The clean high-yield elimination of a metal centre from a polyhedral metallaborane or metallaheteroborane species is very rare.

Bis(μ-carboxylato)dienerhodium(I) Complexes - Synthesis, Characterization and Catalytic Activity

2008 ◽  
Vol 73 (8-9) ◽  
pp. 1205-1221 ◽  
Author(s):  
Jiří Zedník ◽  
Jan Sedláček ◽  
Jan Svoboda ◽  
Jiří Vohlídal ◽  
Dmitrij Bondarev ◽  
...  
Keyword(s):  
Catalytic Activity ◽  
Diffraction Analysis ◽  
Spectroscopic Methods ◽  
X Ray Diffraction ◽  
X Ray

Dinuclear rhodium(I) η2:η2-cycloocta-1,5-diene (series a) and η2:η2-norborna-2,5-diene (series b) complexes with μ-RCOO- ligands, where R is linear C21H43 (complexes 1a, 1b), CH2CMe3 (2a, 2b), 1-adamantyl (3a, 3b) and benzyl (4a, 4b), have been prepared and characterized by spectroscopic methods. Structures of complexes 2b, 3a and 4a were determined by X-ray diffraction analysis. Complexes prepared show low to moderate catalytic activity in polymerization of phenylacetylene in THF giving high-cis-transoid polymers, but they show only oligomerization activity in dichloromethane.

scholarly journals Crystals of the trp repressor-operator complex suitable for X-ray diffraction analysis.

1987 ◽  
Vol 262 (10) ◽  
pp. 4917-4921 ◽  
Author(s):  
A. Joachimiak ◽  
R.Q. Marmorstein ◽  
R.W. Schevitz ◽  
W. Mandecki ◽  
J.L. Fox ◽  
...  
Keyword(s):  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
Trp Repressor ◽  
X Ray
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