Characterization of molecular assemblies on silicon surfaces by attenuated total reflectance infrared spectroscopy
2015 ◽
Vol 48
(15)
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pp. 2380-2390
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1994 ◽
Vol 71
(4)
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pp. 371-377
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2013 ◽
Vol 5
(17)
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pp. 8300-8307
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