Universal scheme for measuring the electron in semiconductors and application to a lightly-doped -GaAs sample
2012 ◽
Vol 152
(5)
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pp. 410-413
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2012 ◽
Vol 23
(17)
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pp. 2201-2211
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Keyword(s):
2014 ◽
Vol 20
(6)
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pp. 1740-1752
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1994 ◽
Vol 6
(2)
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pp. 316-330
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Keyword(s):