Simulated fault injection methodology for gate-level quantum circuit reliability assessment
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2013 ◽
Vol 53
(9-11)
◽
pp. 1230-1234
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2010 ◽
Vol 50
(2)
◽
pp. 304-311
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2011 ◽
Vol 51
(9-11)
◽
pp. 1459-1463
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