Corrigendum to “Dislocation density measurement by electron channeling contrast imaging in a scanning electron microscope” [Scripta Materialia 66 (2012) 343–346]

2012 ◽  
Vol 66 (9) ◽  
pp. 720 ◽  
Author(s):  
I. Gutierrez-Urrutia ◽  
D. Raabe
Keyword(s):  
Electron Microscope ◽  
Dislocation Density ◽  
Scanning Electron Microscope ◽  
Density Measurement ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Scanning Electron

scholarly journals Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope

2013 ◽  
Vol 102 (14) ◽  
pp. 142103 ◽  
Author(s):  
G. Naresh-Kumar ◽  
C. Mauder ◽  
K. R. Wang ◽  
S. Kraeusel ◽  
J. Bruckbauer ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Imaging Studies ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Scanning Electron

Charge Contrast Imaging (CCI) in the Environmental Scanning Electron Microscope: Optimizing Operating Parameters for Calcite

2001 ◽  
Vol 7 (S2) ◽  
pp. 780-781
Author(s):  
Eric Doehne ◽  
David Carson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Defect Density ◽  
Imaging System ◽  
Environmental Scanning Electron Microscope ◽  
Small Scale ◽  
Environmental Scanning ◽  
Contrast Imaging ◽  
Wide Range ◽  
Scanning Electron

Charge contrast imaging (CCI) is a useful new method for imaging sub-micron features in crystalline materials using the unique gas/ion/electron imaging system of the environmental scanning electron microscope (Griffin, 1997; Doehne, 1998). Crystal growth zoning, microfractures, solution boundaries, and areas of chemical alteration or recrystallization can be imaged in a wide range of materials (Griffin, 2000; Watt, et al. 2000). While not fully understood, charge contrast images reflect differences in the ability of materials to accept, store and discharge deposited electrons from the primary electron beam. These differences are expressed, in turn, as contrasts in secondary electron emission from flat samples (e.g. these contrasts are not related to topography, as is usually the case). Charge contrast appears be related to differences in electronic properties which are often controlled by defect density. CCI is also affected by small-scale physical defects (such as microfractures) which appear to affect the distribution and timing of charge buildup and discharge in the sample (Johansen, et al. 1997).

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