Linking the microstructure, performance and durability of Ni-yttria-stabilized zirconia solid oxide fuel cell anodes using three-dimensional focused ion beam–scanning electron microscopy imaging

2011 ◽  
Vol 65 (2) ◽  
pp. 67-72 ◽  
Author(s):  
James R. Wilson ◽  
J. Scott Cronin ◽  
Scott A. Barnett
Keyword(s):  
Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Solid Oxide ◽  
Yttria Stabilized Zirconia ◽  
Oxide Fuel ◽  
Stabilized Zirconia ◽  
Microscopy Imaging ◽  
Scanning Electron

Three Dimensional Reconstruction of Solid Oxide Fuel Cell Electrodes Using Focused Ion Beam - Scanning Electron Microscopy

2019 ◽  
Vol 7 (1) ◽  
pp. 1879-1887 ◽  
Author(s):  
James Wilson ◽  
Worawarit Kobsiriphat ◽  
Roberto Mendoza ◽  
Hsun-Yi Chen ◽  
Tom Hines ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Solid Oxide ◽  
Oxide Fuel ◽  
Fuel Cell Electrodes ◽  
Dimensional Reconstruction ◽  
Scanning Electron

Three-Dimensional Semiconductor Device Investigation Using Focused Ion Beam and Scanning Electron Microscopy Imaging (FIB/SEM Tomography)

2013 ◽  
Vol 19 (1) ◽  
pp. 85-92 ◽  
Author(s):  
K. Lepinay ◽  
F. Lorut
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Semiconductor Device ◽  
Ion Beam ◽  
Three Dimensional ◽  
Turnaround Time ◽  
Volume Reconstruction ◽  
Microscopy Imaging ◽  
Scanning Electron

AbstractThree-dimensional focused ion beam/scanning electron microscopy (FIB/SEM tomography) is currently an important technique to characterize in 3D a complex semiconductor device or a specific failure. However, the industrial context demands low turnaround time making the technique less useful. To make it more attractive, the following study focuses on a specific methodology going from sample preparation to the final volume reconstruction to reduce the global time analysis while keeping reliable results. The FIB/SEM parameters available will be first analyzed to acquire a relevant dataset in a reasonable time (few hours). Then, a new alignment strategy based on specific alignment marks [using tetraethoxylisane (TEOS) and Pt deposition] is proposed to improve the volume reconstruction speed. These points combined represent a considerable improvement regarding the reliability of the results and the time consumption (gain of factor 3). This method is then applied to various case studies illustrating the benefits of the FIB/SEM tomography technique such as the precise identification of the origin of 3D defects, or the capability to perform a virtual top-down deprocessing on soft material not possible by any mechanical solution.

scholarly journals Thin Solid Film Electrolyte and Its Impact on Electrode Polarization in Solid Oxide Fuel Cells Studied by Three-Dimensional Microstructure-Scale Numerical Simulation

Energies ◽  
2020 ◽  
Vol 13 (19) ◽  
pp. 5127
Author(s):  
Tomasz A. Prokop ◽  
Grzegorz Brus ◽  
Shinji Kimijima ◽  
Janusz S. Szmyd
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Reaction Rates ◽  
Solid Oxide ◽  
Scale Model ◽  
Electrode Polarization ◽  
Computational Domain ◽  
Oxide Fuel ◽  
The Impact

In this work, a three-dimensional microstructure-scale model of a Solid Oxide Fuel Cell’s Positive-Electrolyte-Negative assembly is applied for the purpose of investigating the impact of decreasing the electrolyte thickness on the magnitude, and the composition of electrochemical losses generated within the cell. Focused-Ion-Beam Scanning Electron Microscopy reconstructions are used to construct a computational domain, in which charge transport equations are solved. Butler–Volmer model is used to compute local reaction rates, and empirical relationships are used to obtain local conductivities. The results point towards three-dimensional nature of transport phenomena in thin electrolytes, and electrode-electrolyte interfaces.

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