Evidence of two-length-scale kinetics of R-phase transformation by high-energy X-ray diffraction

2010 ◽  
Vol 62 (8) ◽  
pp. 617-620 ◽  
Author(s):  
Y.D. Wang ◽  
Y. Ren ◽  
E.W. Huang ◽  
G. Wang ◽  
Z.H. Nie ◽  
...  
Materials ◽  
2018 ◽  
Vol 11 (8) ◽  
pp. 1415 ◽  
Author(s):  
Guillaume Geandier ◽  
Lilian Vautrot ◽  
Benoît Denand ◽  
Sabine Denis

In situ high-energy X-ray diffraction using a synchrotron source performed on a steel metal matrix composite reinforced by TiC allows the evolutions of internal stresses during cooling to be followed thanks to the development of a new original experimental device (a transportable radiation furnace with controlled rotation of the specimen). Using the device on a high-energy beamline during in situ thermal treatment, we were able to extract the evolution of the stress tensor components in all phases: austenite, TiC, and even during the martensitic phase transformation of the matrix.


2007 ◽  
Vol 42 (8) ◽  
pp. 2830-2836 ◽  
Author(s):  
Maria Iaponeide Fernandes Macêdo ◽  
Celso Aparecido Bertran ◽  
Carla Cristiane Osawa

2016 ◽  
Vol 31 (2) ◽  
pp. 104-109 ◽  
Author(s):  
Baozhuo Zhang ◽  
Marcus L. Young

Many technological applications of austenitic shape memory alloys (SMAs) involve cyclical mechanical loading and unloading in order to take advantage of pseudoelasticity. In this paper, we investigated the effect of mechanical bending of pseudoelastic NiTi SMA wires using high-energy synchrotron radiation X-ray diffraction (SR-XRD). Differential scanning calorimetry was performed to identify the phase transformation temperatures. Scanning electron microscopy images show that micro-cracks in compressive regions of the wire propagate with increasing bend angle, while tensile regions tend not to exhibit crack propagation. SR-XRD patterns were analyzed to study the phase transformation and investigate micromechanical properties. By observing the various diffraction peaks such as the austenite (200) and the martensite (${\bar 1}12$), (${\bar 1}03$), (${\bar 1}11$), and (101) planes, intensities and residual strain values exhibit strong anisotropy, depending upon whether the sample is in compression or tension during bending.


2006 ◽  
Vol 39 (6) ◽  
pp. 850-855 ◽  
Author(s):  
E. MacA. Gray ◽  
D. J. Cookson ◽  
T. P. Blach

A pressure cell designed for high-energy X-ray diffraction in transmission mode is described. The cell is intended for use at temperatures up to 573 K with samples that are large enough to permit the real-time determination of the amount of absorbed gas by measuring the gas pressure. The design is driven by the need to ensure that the sample temperature is constant and uniform, despite the heat flow accompanying the reaction between the gas and the sample. The use of the cell is illustrated by its application to elucidating the hydriding phase transformation in the LaNi5–H2system.


2014 ◽  
Vol 16 (8) ◽  
pp. 1044-1051 ◽  
Author(s):  
Piyada Suwanpinij ◽  
Andreas Stark ◽  
Xiaoxiao Li ◽  
Frank Römer ◽  
Klaus Herrmann ◽  
...  

2010 ◽  
Vol 163 ◽  
pp. 295-298 ◽  
Author(s):  
Jan Drahokoupil ◽  
Petr Haušild ◽  
Vadim Davydov ◽  
P. Pilvin

Kinetics of deformation induced martensitic transformation in metastable austenitic AISI 301 steel was characterized by several techniques including classical light metallography, X-ray diffraction, neutron diffraction and electron back scattered diffraction. In order to characterize the martensitic transformation, several specimens were tensile pre-deformed to 5%, 10% and 20% of plastic deformation and compared with non-deformed state. During straining, the volume fraction of α’-martensite rapidly prevails over the volume fraction of original austenite and reach the value circa 70%.


2006 ◽  
Vol 13 (02n03) ◽  
pp. 155-166 ◽  
Author(s):  
WOLFGANG BRAUN ◽  
KLAUS H. PLOOG

X-rays are ideal to study the structure of crystals due to their weak interaction with matter and in most cases allow a quantitative analysis using kinematical theory. To study the incorporation of atoms during crystal growth and to analyze the kinetics on the crystal surface high primary beam intensities available at synchrotrons are required. Our studies of the molecular beam epitaxy growth of III–V semiconductors reveal that, despite their similarity in crystal structure, the surface kinetics of GaAs (001), InAs (001) and GaSb (001) differ strongly. GaAs shows an unexpectedly large coarsening exponent outside the predicted range of Ostwald ripening models during recovery. GaSb exhibits dramatically different surface morphology variations during growth and recovery. Overgrowth of GaAs by epitaxial MnAs demonstrates the ability of X-ray diffraction to follow an interface as it is buried during heteroepitaxy, which is not possible by reflection high-energy electron diffraction.


2006 ◽  
Vol 519-521 ◽  
pp. 1569-1578
Author(s):  
Dorte Juul Jensen

By 3 dimensional X-ray diffraction (3DXRD) using high energy X-rays from synchrotron sources it is possible to study in-situ the nucleation and growth during recrystallization. In this paper it is described and discussed how 3DXRD can supplement EBSP measurements of nucleation and growth. Three types of studies are considered: i) orientation relationships between nuclei and parent deformed matrix, ii) recrystallization kinetics of individual bulk grains and iii) filming of growing grains in deformed single crystals.


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