Transmission electron microscopy study of the microstructure of B19 martensite in sputter-deposited Ti50.2Ni30Cu19.8 thin films

2008 ◽  
Vol 59 (4) ◽  
pp. 451-454 ◽  
Author(s):  
X MENG ◽  
M SATO ◽  
A ISHIDA
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Transmission Electron Microscopy Study ◽  
Transmission Electron ◽  
Sputter Deposited

Transmission Electron Microscopy Study of CoPt(001) and FePt(001) Films Formed from Epitaxial Co/Pt and Fe/Pt Multilayers

1993 ◽  
Vol 311 ◽  
Author(s):  
MR.M. Visokay ◽  
BM.B. Lairson ◽  
B.B. Clemens ◽  
R. Sinclair
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Easy Axis ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Direct Result ◽  
Transmission Electron Microscopy Study ◽  
Transmission Electron ◽  
Magnetic Easy Axis ◽  
Sputter Deposited

ABSTRACTTransmission electron microscopy was performed on epitaxial Fe/Pt and Co/Pt [001] oriented multilayers that were sputter deposited onto single crystal [001] MgO. Films were examined as-deposited and after annealing in vacuum. Before annealing, the films had a magnetic easy axis in the plane while after annealing the easy axis was out of the plane. Perpendicular anisotropies of 8× 106 erg/cm3 and 1.9x 107 erg/cm3 were measured for the Fe/Pt and Co/Pt post-annealed films. Large magneto-optic Kerr rotations were also measured, 0.6° and 0.4° for the Fe/Pt and Co/Pt annealed films, respectively. Changes in the magnetic properties were a direct result of the transformation of the multilayer into c axis oriented FePt and CoPt intermetallic compounds upon annealing.

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