scholarly journals Focused Electron Beam Induced Processing, a Technology to Develop and Produce Miniaturized Electron-, IR, THz-, X-ray Sources, High Resolution Detectors and Sensors for IR-and X-ray Tomography

2012 ◽  
Vol 47 ◽  
pp. 1460-1465 ◽  
Author(s):  
Hans W.P. Koops
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
X Ray

New high‐resolution charge transfer x‐ray and electron beam negative resist

1980 ◽  
Vol 37 (3) ◽  
pp. 314-316 ◽  
Author(s):  
Donald C. Hofer ◽  
Frank B. Kaufman ◽  
Steven R. Kramer ◽  
Ari Aviram
Keyword(s):  
Electron Beam ◽  
Charge Transfer ◽  
High Resolution ◽  
X Ray

Wide-band, high-resolution soft x-ray spectrometer for the Electron Beam Ion Trap

1999 ◽  
Vol 70 (1) ◽  
pp. 280-283 ◽  
Author(s):  
G. V. Brown ◽  
P. Beiersdorfer ◽  
K. Widmann
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Ion Trap ◽  
Wide Band ◽  
X Ray ◽  
Electron Beam Ion Trap

New high resolution and high sensitivity deep UV, x-ray, and electron beam resists

1990 ◽  
Vol 11 (1-4) ◽  
pp. 487-489 ◽  
Author(s):  
Michael Hatzakis ◽  
Kevin J. Stewart ◽  
Jane M. Shaw ◽  
Stephen A. Rishton
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
High Sensitivity ◽  
X Ray ◽  
Deep Uv

Spectra of Ni- and Co-like ions of Xe in an electron-beam ion trap

2008 ◽  
Vol 86 (3) ◽  
pp. 467-475 ◽  
Author(s):  
E Träbert ◽  
P Beiersdorfer ◽  
M F Gu
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Ion Trap ◽  
Energy Levels ◽  
X Ray ◽  
Calculated Energy ◽  
Electron Beam Ion Trap ◽  
34.50 Fa

High-resolution soft X-ray observations of Ni- and Co-like Xe ions in an electron-beam ion trap are compared with the predictions of various calculations. Calculated energy levels up to the 4p levels are presented alongside experimental determinations. PACS Nos.: 32.30.Rj; 34.50.Fa; 34.80.Dp

High-resolution x-ray spectromicroscopy with the Tokyo electron beam ion trap

1999 ◽  
Vol 70 (3) ◽  
pp. 1658-1664 ◽  
Author(s):  
N. Nakamura ◽  
A. Ya. Faenov ◽  
T. A. Pikuz ◽  
E. Nojikawa ◽  
H. Shiraishi ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Ion Trap ◽  
X Ray ◽  
Electron Beam Ion Trap

Very high resolution soft x-ray spectrometer for an electron beam ion trap

1997 ◽  
Vol 68 (1) ◽  
pp. 1077-1079 ◽  
Author(s):  
P. Beiersdorfer ◽  
J. R. Crespo López-Urrutia ◽  
E. Förster ◽  
J. Mahiri ◽  
K. Widmann
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Ion Trap ◽  
X Ray ◽  
Electron Beam Ion Trap ◽  
Very High

Electron beam-induced surface modification and nano-engineering of carbon nanotubes: Single-walled and multiwalled

2006 ◽  
Vol 21 (12) ◽  
pp. 3109-3123 ◽  
Author(s):  
S. Gupta ◽  
R.J. Patel ◽  
R.E. Giedd
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Raman Spectroscopy ◽  
Electron Beam ◽  
Electron Microscope ◽  
High Resolution ◽  
Band Intensity ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

Influence of low and medium energy electron beam (E-beam) irradiation on the single-walled (SW) and multiwalled (MW) carbon nanotube films grown by microwave chemical vapor deposition are investigated. These films were subjected to electron beam energy of 50 keV from scanning electron microscope for 2.5, 5.5, 8.0, and 15 h and 100, 200, and 300 keV from transmission electron microscope electron gun for a few minutes to approximately 2 h continuously. To assess the surface modifications/structural degradation, the films were analyzed prior to and post-irradiation using x-ray diffraction and micro-Raman spectroscopy in addition to in situ monitoring by scanning and high-resolution transmission electron microscopy. A minimal increase in intertube or interplanar spacing (i.e., d002) for MW nanotubes ranging from 3.25–3.29 Å (∼3%) can be analogized to change in c-axis of graphite lattice due to thermal effects measured using x-ray diffraction. Resonance Raman spectroscopy revealed that irradiation generated defects in the lattice evaluated through variation of: the intensity of radial breathing mode (RBM), intensity ratio of D to G band (ID/IG), position of D and G bands and their harmonics (D* and G*). The increase in the defect-induced D band intensity, quenching of RBM intensity, and only a slight increase in G band intensity are some of the implications. The MW nanotubes tend to reach a state of saturation for prolonged exposures, while SW transforming semiconducting to quasi-metallic character. Softening of the q = 0 selection rule is suggested as a possible way to explain these results. It is also suggestive that knock-on collision may not be the primary cause of structural degradation, rather a local gradual reorganization, i.e., sp2+δ ⇔ sp2+δ, sp2 C seems quite possible. Experiments showed that with extended exposures, both kinds of nanotubes displayed various local structural instabilities including pinching, graphitization/amorphization, and forming intra-molecular junction (IMJ) within the area of electron beam focus possibly through amorphous carbon aggregates. They also displayed curling and closure forming nano-ring and helix-like structures while mending their dangling bonds. High-resolution transmission electron microscopy electrons corroborated these conclusions. Manufacturing of nanoscale structures “nano-engineering” of carbon-based systems is tentatively ascribed to irradiation-induced solid-state phase transformation, in contrast to conventional nanotube synthesis from the gas phase.

High‐resolution x‐ray spectrometer for an electron beam ion trap

1990 ◽  
Vol 61 (9) ◽  
pp. 2338-2342 ◽  
Author(s):  
P. Beiersdorfer ◽  
R. E. Marrs ◽  
J. R. Henderson ◽  
D. A. Knapp ◽  
M. A. Levine ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Ion Trap ◽  
X Ray ◽  
Electron Beam Ion Trap

Flat-field grating spectrometer for high-resolution soft x-ray and extreme ultraviolet measurements on an electron beam ion trap

2004 ◽  
Vol 75 (10) ◽  
pp. 3723-3726 ◽  
Author(s):  
P. Beiersdorfer ◽  
E. W. Magee ◽  
E. Träbert ◽  
H. Chen ◽  
J. K. Lepson ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Ion Trap ◽  
Extreme Ultraviolet ◽  
X Ray ◽  
Grating Spectrometer ◽  
Electron Beam Ion Trap ◽  
Flat Field
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