Thermal distribution analysis and suppression mechanism of carbonized tracking and erosion in silicone rubber/SiO2 nanocomposites

2018 ◽  
Vol 70 ◽  
pp. 226-233 ◽  
Author(s):  
M. Tariq Nazir ◽  
B.T. Phung ◽  
Shihu Yu ◽  
Shengtao Li ◽  
Dongri Xie ◽  
...  
Author(s):  
Maslina Yaacob ◽  
Mohd Haniff Ibrahim ◽  
Norazan Mohd Kassim ◽  
Abu Bakar Mohammad

In this paper, the analysis of thermal distribution in planar optical waveguide cross-section when a single heater electrode applied is presented. Starting from the heat equation, the thermal analysis has been done using two proposed numerical methods which are include finite difference method (FDM) and finite element method (FEM). By considering conduction as the only heat transfer mechanism, the obtained results from the mentioned methods are shown to have a good agreement.


High Voltage ◽  
2018 ◽  
Vol 3 (4) ◽  
pp. 289-294 ◽  
Author(s):  
Muhammad Tariq Nazir ◽  
Bao Toan Phung ◽  
Shihu Yu ◽  
Yuanyuan Zhang ◽  
Shengtao Li

2018 ◽  
Vol 38 ◽  
pp. 04026
Author(s):  
Chuan Kai Jiang ◽  
Lei Nie ◽  
Wen Jia ◽  
Yu Ning Zhong

In order to uncover the external manifestations of TSV internal defects, the finite element models of typical internal defects, which were filling missing, axial cavity and end cavity, were established. The thermal analysis was carried out using thermoelectric coupling method. The temperature distribution of TSV with and without defects were obtained. And the temperature variation profiles on the defined paths of TSV layer were also analyzed. The analysis indicated that all the defective TSV showed distinct temperature distribution with the defect-free TSV. Among three typical defects, TSV with filling missing showed the most obvious difference on the temperature distribution and path variation. TSV with end cavity has relatively weak affect and the slightest defect was TSV with axial cavity. Therefore, it could be seen that the external temperature difference caused by the internal defects of TSV could provide effective information for the identification and detection in TSV with internal defects.


2015 ◽  
Vol 54 (9) ◽  
pp. 1363-1373 ◽  
Author(s):  
Asnida Abd Wahab ◽  
Maheza Irna Mohamad Salim ◽  
Mohamad Asmidzam Ahamat ◽  
Noraida Abd Manaf ◽  
Jasmy Yunus ◽  
...  

Author(s):  
A. H. M. Nasib ◽  
M. H. Ahmad ◽  
Z. Nawawi ◽  
M. A. B. Sidik ◽  
M. I. Jambak

This article presents a study on electrical treeing performances with its associated partial discharge (PD) and the influence of filler concentration in silicone rubber (SiR) samples which are filled with silicon dioxide (SiO2) and silicon nitride (Si3N4) as nanofillers for electrical tree growth suppression. There are many researches on electrical treeing in SiR with SiO2 nanofillers but none of the publication have reported on Si3N4 nanofillers for suppression of the electrical tree growth. In this study, the treeing experiments were conducted by applying a fixed AC voltage of 10 kV and 12 kV at power frequency of 50 Hz on unfilled SiR, SiR/SiO2, and SiR/Si3N4 nanocomposites with different filler concentrations by 1, 3, and 5 weight percentage (wt%) and the electrical treeing parameters were observed with its correlated PD patterns. The outcome from this study found that the SiR/Si3N4 nanocomposites were able to withstand the electrical treeing better than the pure SiR or SiR/SiO2 nanocomposites. Furthermore, the increase in filler concentration improved the electrical tree performances of the nanocomposites. This finding suggests the Si3N4 can be used as filler in polymeric insulating materials for electrical tree inhibition. Meanwhile, the PD activity shows increment when the tree progresses thereby indicating correlation in both parameters which can be as key parameter for monitoring unseen electrical treeing in the opaque samples.


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