scholarly journals Temperature-dependent dynamic moduli of Parylene-C columnar microfibrous thin films

2016 ◽  
Vol 53 ◽  
pp. 89-97 ◽  
Author(s):  
Chandraprakash Chindam ◽  
Nicole R. Brown ◽  
Akhlesh Lakhtakia ◽  
Osama O. Awadelkarim ◽  
Wasim Orfali
Keyword(s):  
Thin Films ◽  
Temperature Dependent ◽  
Dynamic Moduli ◽  
Parylene C

Frequency- and temperature-dependent storage and loss moduli of microfibrous thin films of Parylene C

2014 ◽  
Vol 116 ◽  
pp. 296-298 ◽  
Author(s):  
Chandraprakash Chindam ◽  
Akhlesh Lakhtakia ◽  
Nicole R. Brown ◽  
Wasim Orfali ◽  
Osama O. Awadelkarim
Keyword(s):  
Thin Films ◽  
Temperature Dependent ◽  
Parylene C ◽  
Storage And Loss Moduli

scholarly journals Direct measurement of the thermoelectric properties of electrochemically deposited Bi2Te3 thin films

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Jose Recatala-Gomez ◽  
Pawan Kumar ◽  
Ady Suwardi ◽  
Anas Abutaha ◽  
Iris Nandhakumar ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermoelectric Properties ◽  
Bismuth Telluride ◽  
Indium Tin Oxide ◽  
Seed Layer ◽  
Room Temperature ◽  
Low Cost ◽  
Temperature Dependent ◽  
Temperature Heat ◽  
Electrochemically Deposited

Abstract The best known thermoelectric material for near room temperature heat-to-electricity conversion is bismuth telluride. Amongst the possible fabrication techniques, electrodeposition has attracted attention due to its simplicity and low cost. However, the measurement of the thermoelectric properties of electrodeposited films is challenging because of the conducting seed layer underneath the film. Here, we develop a method to directly measure the thermoelectric properties of electrodeposited bismuth telluride thin films, grown on indium tin oxide. Using this technique, the temperature dependent thermoelectric properties (Seebeck coefficient and electrical conductivity) of electrodeposited thin films have been measured down to 100 K. A parallel resistor model is employed to discern the signal of the film from the signal of the seed layer and the data are carefully analysed and contextualized with literature. Our analysis demonstrates that the thermoelectric properties of electrodeposited films can be accurately evaluated without inflicting any damage to the films.

Extraction of the Coefficient of Thermal Expansion of Thin Films from Buckled Membranes

1998 ◽  
Vol 546 ◽  
Author(s):  
V. Ziebartl ◽  
O. Paul ◽  
H. Baltes
Keyword(s):  
Thin Films ◽  
Finite Element ◽  
Thermal Expansion ◽  
Silicon Nitride ◽  
Excellent Agreement ◽  
Energy Minimization ◽  
Coefficient Of Thermal Expansion ◽  
Temperature Dependent ◽  
Minimization Method ◽  
Energy Minimization Method

AbstractWe report a new method to measure the temperature-dependent coefficient of thermal expansion α(T) of thin films. The method exploits the temperature dependent buckling of clamped square plates. This buckling was investigated numerically using an energy minimization method and finite element simulations. Both approaches show excellent agreement even far away from simple critical buckling. The numerical results were used to extract Cα(T) = α0+α1(T−T0 ) of PECVD silicon nitride between 20° and 140°C with α0 = (1.803±0.006)×10−6°C−1, α1 = (7.5±0.5)×10−9 °C−2, and T0 = 25°C.

Temperature dependent structural, luminescent and XPS studies of CdO:Ga thin films deposited by spray pyrolysis

2010 ◽  
Vol 506 (2) ◽  
pp. 794-799 ◽  
Author(s):  
A.V. Moholkar ◽  
G.L. Agawane ◽  
Kyu-Ung Sim ◽  
Ye-bin Kwon ◽  
Doo Sun Choi ◽  
...  
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Temperature Dependent

Valence photoemission study of temperature dependent reaction products in Ni-Si interfaces and thin films

1982 ◽  
Vol 43 (3) ◽  
pp. 199-202 ◽  
Author(s):  
I. Abbati ◽  
L. Braicovich ◽  
B. De Michelis ◽  
U. del Pennino ◽  
S. Valeri
Keyword(s):  
Thin Films ◽  
Reaction Products ◽  
Temperature Dependent ◽  
Photoemission Study

Size- and temperature-dependent Young's modulus and size-dependent thermal expansion coefficient of thin films

2016 ◽  
Vol 18 (31) ◽  
pp. 21508-21517 ◽  
Author(s):  
Xiao-Ye Zhou ◽  
Bao-Ling Huang ◽  
Tong-Yi Zhang
Keyword(s):  
Thin Films ◽  
Thermal Expansion ◽  
Young’S Modulus ◽  
Thermal Expansion Coefficient ◽  
Expansion Coefficient ◽  
Material Properties ◽  
Essential Role ◽  
Young's Modulus ◽  
Temperature Dependent ◽  
Size Dependent

Surfaces of nanomaterials play an essential role in size-dependent material properties.

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