Electromechanical characterization of piezoelectric polymer thin films in a broad frequency range

2014 ◽  
Vol 37 ◽  
pp. 163-169 ◽  
Author(s):  
M.G. Gonzalez ◽  
P.A. Sorichetti ◽  
L. Ciocci Brazzano ◽  
G.D. Santiago
Keyword(s):  
Thin Films ◽  
Polymer Thin Films ◽  
Frequency Range ◽  
Broad Frequency Range ◽  
Piezoelectric Polymer ◽  
Electromechanical Characterization

Broadband Coherent Anti-Stokes Raman Spectroscopy Characterization of Polymer Thin Films

2006 ◽  
Vol 60 (10) ◽  
pp. 1097-1102 ◽  
Author(s):  
Zachary D. Schultz ◽  
Marc C. Gurau ◽  
Lee J. Richter
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Polymer Thin Films ◽  
Anti Stokes

Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate

2014 ◽  
Author(s):  
Stefan Prorok ◽  
Marvin Schulz ◽  
Alexander Petrov ◽  
Manfred Eich ◽  
Jingdong Luo ◽  
...  
Keyword(s):  
Thin Films ◽  
Silicon Substrate ◽  
Polymer Thin Films ◽  
Electro Optic

Fabrication and Mechanical Characterization of Semi-Free-Standing (Conjugated) Polymer Thin Films

Langmuir ◽  
2013 ◽  
Vol 30 (18) ◽  
pp. 5217-5223 ◽  
Author(s):  
Jaime Martín ◽  
Miguel Muñoz ◽  
Mario Encinar ◽  
Montserrat Calleja ◽  
Marisol Martín-González
Keyword(s):  
Thin Films ◽  
Conjugated Polymer ◽  
Mechanical Characterization ◽  
Polymer Thin Films ◽  
Free Standing

scholarly journals Piezoelectric polymer thin films with architected cuts

2018 ◽  
Vol 33 (3) ◽  
pp. 330-342 ◽  
Author(s):  
Lichen Fang ◽  
Jing Li ◽  
Zeyu Zhu ◽  
Santiago Orrego ◽  
Sung Hoon Kang
Keyword(s):  
Thin Films ◽  
Polymer Thin Films ◽  
Piezoelectric Polymer ◽  
Image Position

Abstract

High Frequency Ultrasound, a Tool for Elastic Properties Measurement of Thin Films Fabricated on Silicon

2011 ◽  
Vol 324 ◽  
pp. 277-281 ◽  
Author(s):  
Pierre Campistron ◽  
Julien Carlier ◽  
Nadine Saad ◽  
Jamin Gao ◽  
Malika Toubal ◽  
...  
Keyword(s):  
Thin Films ◽  
Elastic Properties ◽  
High Frequency ◽  
Shear Waves ◽  
Thin Layers ◽  
Acoustic Properties ◽  
Frequency Range ◽  
Frequency Method ◽  
Longitudinal Waves

The main goal of this work is to develop an ultrasonic high frequency method for characterization of thin layers. The development of high frequency acoustic transducers for longitudinal waves and shear waves on silicon has enabeled the characterization of thin films deposited on this substrate. Three types of transducers have been achieved : (i) single crystal LiNbOSubscript text3 Y+163° for shear waves generation, and (ii) Y+36° for longitudinal waves, bonded and thinned on silicon substrate to achieve ultrasonic transducers in the frequency range 300-600 MHz ; (iii) thin films ZnO transducers were realized due to sputtering technologies working in the frequency range 1 GHz- 2.5 GHz. Using an inversion method and a network analyser which provide the scattering S11 parameter of the transducer versus the frequency we deduce the elastic properties of films deposited on the wafer surface. Thanks to these transducers the acoustic properties of thin films such as SU-8 based nanocomposites (doped with TiO2 , SrTiO3 or W nanoparticles) will be presented. In order to achieve mechanical impedance matching between silicon and water we control the mass of the embedded particles which provide a way to adjust the elastic properties of the characterized material. In another application an Indium metallic layer have been characterized in the high frequency range. We also use this method to characterize dielectric permittivity of the ZnO transducers.

Organic and Inorganic Hybrid-Polymer Thin Films by PECVD Method and Characterization of Their Electrical and Optical Properties

2007 ◽  
Vol 4 (S1) ◽  
pp. S812-S816 ◽  
Author(s):  
In-Seob Bae ◽  
Sang-Jin Cho ◽  
Seong-Hun Jeong ◽  
Hyung Jun Cho ◽  
Byungyou Hong ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Polymer Thin Films ◽  
Hybrid Polymer ◽  
Electrical And Optical Properties ◽  
Inorganic Hybrid
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