scholarly journals Scanning angle Raman spectroscopy: A nondestructive method for simultaneously determining mixed polymer fractional composition and film thickness

Polymer ◽  
2016 ◽  
Vol 107 ◽  
pp. 82-88 ◽  
Author(s):  
Jonathan M. Bobbitt ◽  
Deyny Mendivelso-Pérez ◽  
Emily A. Smith
Keyword(s):  
Raman Spectroscopy ◽  
Film Thickness ◽  
Fractional Composition ◽  
Nondestructive Method ◽  
Scanning Angle

Residual Stress Measurement in Silicon Substrate After Local Thermal Oxidation Using Microscopic Raman Spectroscopy

1991 ◽  
Vol 226 ◽  
Author(s):  
Hideo Miura ◽  
Hiroshi Sakata ◽  
Shinji Sakata Merl
Keyword(s):  
Residual Stress ◽  
Raman Spectroscopy ◽  
Tensile Stress ◽  
Oxide Film ◽  
Film Thickness ◽  
Silicon Dioxide ◽  
Thermal Oxidation ◽  
Silicon Substrate ◽  
Nitride Film ◽  
Oxide Film Thickness

AbstractThe residual stress in silicon substrates after local thermal oxidation is discussed experimentally using microscopic Raman spectroscopy. The stress distribution in the silicon substrate is determined by three main factors: volume expansion of newly grown silicon–dioxide, deflection of the silicon–nitride film used as an oxidation barrier, and mismatch in thermal expansion coefficients between silicon and silicon dioxide.Tensile stress increases with the increase of oxide film thickness near the surface of the silicon substrate under the oxide film without nitride film on it. The tensile stress is sometimes more than 100 MPa. On the other hand, a complicated stress change is observed near the surface of the silicon substrate under the nitride film. The tensile stress increases initially, as it does in the area without nitride film on it. However, it decreases with the increase of oxide film thickness, then the compressive stress increases in the area up to 170 MPa. This stress change is explained by considering the drastic structural change of the oxide film under the nitride film edge during oxidation.

scholarly journals Evaluating Molecular Evolution of Kerogen by Raman Spectroscopy: Correlation with Optical Microscopy and Rock-Eval Pyrolysis

Energies ◽  
2018 ◽  
Vol 11 (6) ◽  
pp. 1406 ◽  
Author(s):  
Seyedalireza Khatibi ◽  
Mehdi Ostadhassan ◽  
David Tuschel ◽  
Thomas Gentzis ◽  
Humberto Carvajal-Ortiz
Keyword(s):  
Raman Spectroscopy ◽  
Organic Matter ◽  
Structural Information ◽  
Vitrinite Reflectance ◽  
Nondestructive Method ◽  
Thermal Maturity ◽  
Shale Formations ◽  
Reflectance Analysis ◽  
Rock Eval ◽  
Maturity Parameters

Vitrinite maturity and programmed pyrolysis are conventional methods to evaluate organic matter (OM) regarding its thermal maturity. Moreover, vitrinite reflectance analysis can be difficult if prepared samples have no primary vitrinite or dispersed widely. Raman spectroscopy is a nondestructive method that has been used in the last decade for maturity evaluation of organic matter by detecting structural transformations, however, it might suffer from fluorescence background in low mature samples. In this study, four samples of different maturities from both shale formations of Bakken (the upper and lower members) Formation were collected and analyzed with Rock-Eval (RE) and Raman spectroscopy. In the next step, portions of the same samples were then used for the isolation of kerogen and analyzed by Raman spectroscopy. Results showed that Raman spectroscopy, by detecting structural information of OM, could reflect thermal maturity parameters that were derived from programmed pyrolysis. Moreover, isolating kerogen will reduce the background noise (fluorescence) in the samples dramatically and yield a better spectrum. The study showed that thermal properties of OM could be precisely reflected in Raman signals.

Optical Characterization of C60 Organic Semiconductor and Bilayers

1997 ◽  
Vol 488 ◽  
Author(s):  
J. P. Rainho ◽  
L. Santos ◽  
A. A. Kharlamov
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Optical Absorption ◽  
Film Thickness ◽  
Organic Semiconductor ◽  
Optical Characterization ◽  
Organic Dye ◽  
Zinc Phthalocyanine ◽  
Micro Raman Spectroscopy

AbstractPreparation and characterization either by optical absorption, photoluminescence and micro-Raman spectroscopy of individual components as well as bilayers consisting of organic dye semiconductor Zinc Phthalocyanine (ZnPc) and fullerene, C60, thin films are reported. The layers and structures were deposited in vacuum and some fullerene films were also prepared by casting the C60 solution in benzene. The optical absorption and photoluminescence dependencies on film thickness in bilayers C60/ZnPc were observed and may be discussed in a context of interface induced simmetry reduction of C60 molecules.

scholarly journals 785 nm Raman Spectroscopy of CVD Diamond Films

2007 ◽  
Vol 1039 ◽  
Author(s):  
Paul William May ◽  
James A Smith ◽  
Keith N Rosser
Keyword(s):  
Raman Spectroscopy ◽  
Film Thickness ◽  
Raman Spectra ◽  
Relative Intensity ◽  
Near Infrared ◽  
Diamond Films ◽  
Polycrystalline Diamond ◽  
Cvd Diamond ◽  
Raman Study ◽  
Thin Polycrystalline

AbstractRaman spectroscopy is a powerful technique often used to study CVD diamond films, however, very little work has been reported for the Raman study of CVD diamond films using near infrared (785 nm) excitation. Here, we report that when using 785 nm excitation, the Raman spectra from thin polycrystalline diamond films exhibit a multitude of peaks (over 30) ranging from 400-3000 cm−1. These features are too sharp to be photoluminescence, and are a function of film thickness. For films >30 μm thick, freestanding films, and for films grown in diamond substrates the Raman peaks disappear, suggesting that the laser is probing the disordered small-grained interface between the diamond and substrate. Some of the peaks change in relative intensity with time (‘blinking’), and the spectra are very sensitive to position on the substrate – this is reminiscent of the behaviour seen in SERS spectra.

Magnetic Oil Sorbents based on Technogenic and Natural Inorganic Materials

2021 ◽  
Vol 25 (2) ◽  
pp. 34-40
Author(s):  
Yu.S. Peregudov
Keyword(s):  
Particle Size ◽  
Calcium Carbonate ◽  
Film Thickness ◽  
Water Purification ◽  
Fractional Composition ◽  
Inorganic Materials ◽  
Oil Film ◽  
Complete Absorption ◽  
Oil Films ◽  
Sorption Characteristics

The results of the study of the fractional composition, physicochemical and sorption characteristics of technological calcium carbonate and glauconite are presented. It is shown that the fraction of technological chalk with a particle size of more than 0.125 mm absorbs the greatest amount of oil and gasoline. The oil is better absorbed by the fraction of chalk with a particle size of 0.1–0.25 mm. For glauconite, oil sorption increases with decreasing particle size. The complete absorption of oil on the solid surface by the glauconite sorbent occurred within 2 min and about 10 min by the carbonate sorbent; the recovery rates were 99% and 90%, respectively. The best results in terms of the degree of water purification from oil were shown by a carbonate sorbent with a particle size of more than 0.125 mm – 83 % and glauconite with a particle size of 0.045–0.1 mm – 90% with an oil film thickness of 0.5 mm. The degree of water purification from oil was 80 % for the carbonate sorbent and 93 % for the glauconite one with an oil film thickness of 0.5 mm. With an increase in the thickness of the oil and oil films, the degree of water purification decreases.

Simultaneous Measurement of Film Thickness and Mass Fraction by Raman Spectroscopy

2016 ◽  
Vol 53 (9) ◽  
pp. 093001 ◽  
Author(s):  
王琴 Wang Qin ◽  
赵畅 Zhao Chang ◽  
杨荟楠 Yang Huinan ◽  
苏明旭 Su Mingxu ◽  
蔡小舒 Cai Xiaoshu
Keyword(s):  
Raman Spectroscopy ◽  
Film Thickness ◽  
Simultaneous Measurement ◽  
Mass Fraction
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