scholarly journals Non-linear pair production in scattering of photons on ultra-short laser pulses at high energy

2010 ◽  
Vol 686 (1) ◽  
pp. 29-35 ◽  
Author(s):  
Kirill Tuchin
2012 ◽  
Vol 715 (1-3) ◽  
pp. 246-250 ◽  
Author(s):  
T. Nousch ◽  
D. Seipt ◽  
B. Kämpfer ◽  
A.I. Titov

Author(s):  
F. Wagner ◽  
C. Brabetz ◽  
O. Deppert ◽  
M. Roth ◽  
T. Stöhlker ◽  
...  

Using the example of the PHELIX high-energy short pulse laser we discuss the technical preconditions to investigate ion acceleration with submicrometer thick targets. We show how the temporal contrast of this system was improved to prevent pre-ionization of such targets on the nanosecond timescale. Furthermore the influence of typical fluctuations or uncertainties of the on-target intensity on ion acceleration experiments is discussed. We report how these uncertainties were reduced by improving the assessment and control of the on-shot intensity and by optimizing the positioning of the target into the focal plane. Finally we report on experimental results showing maximum proton energies in excess of 85 MeV for ion acceleration via the target normal sheath acceleration mechanism using target thicknesses on the order of one micrometer.


1997 ◽  
Vol 147 (4) ◽  
pp. 490 ◽  
Author(s):  
John Leavitt ◽  
Michael Fatone ◽  
Charles Hestdalen ◽  
John W. Obringer ◽  
Henry S. Tillinghast

2002 ◽  
Vol 65 (2) ◽  
Author(s):  
A. Staudte ◽  
C. L. Cocke ◽  
M. H. Prior ◽  
A. Belkacem ◽  
C. Ray ◽  
...  

2009 ◽  
Vol 1172 ◽  
Author(s):  
Anja Hanisch-Blicharski ◽  
Boris Krenzer ◽  
Simone Möllenbeck ◽  
Manuel Ligges ◽  
Ping Zhou ◽  
...  

AbstractWith time resolved ultrafast electron diffraction the cooling process across the interface between a thin film and the underlying substrate was studied after excitation with short laser pulses. From the exponential decay of the surface temperature evolution a thermal boundary conductance of 1430 W/(cm2K) is determined for a 9.7 nm thin Bi(111) film on Si(111). A linear dependence between laser fluence and initial temperature rise was measured for film-thicknesses between 2.5 nm and 34.5 nm. The ratio of initial temperature rise and laser fluence for different film-thicknesses is compared to a model taking multilayer optics into account. The data agree well with this model.


2016 ◽  
Vol 94 (1) ◽  
Author(s):  
M. J. A. Jansen ◽  
J. Z. Kamiński ◽  
K. Krajewska ◽  
C. Müller

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