New method for measuring beam profiles using a parametric X-ray pinhole camera
2013 ◽
Vol 377
(38)
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pp. 2577-2580
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1986 ◽
Vol 149
(05)
◽
pp. 69-103
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1959 ◽
Vol 10
(3)
◽
pp. 141-142
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1989 ◽
Vol 60
(7)
◽
pp. 2515-2518
◽
1997 ◽
Vol 185
(1)
◽
pp. 217-227
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