Determination of damping force between atomic force microscope tips and sample using an inverse methodology

Win-Jin Chang; Chao-Ming Lin; Jenn-Fa Lee; Shu-Lian Lin

doi:10.1016/j.physleta.2005.06.005

Determination of damping force between atomic force microscope tips and sample using an inverse methodology

Physics Letters A ◽

10.1016/j.physleta.2005.06.005 ◽

2005 ◽

Vol 343 (1-3) ◽

pp. 79-84 ◽

Cited By ~ 3

Author(s):

Win-Jin Chang ◽

Chao-Ming Lin ◽

Jenn-Fa Lee ◽

Shu-Lian Lin

Keyword(s):

Atomic Force Microscope ◽

Damping Force ◽

Atomic Force

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Determination of performance on tunnel conduction through molecular wire using a conductive atomic force microscope

Applied Physics Letters ◽

10.1063/1.1421233 ◽

2001 ◽

Vol 79 (22) ◽

pp. 3708-3710 ◽

Cited By ~ 47

Author(s):

Hiroshi Sakaguchi ◽

Atsushi Hirai ◽

Futoshi Iwata ◽

Akira Sasaki ◽

Toshihiko Nagamura ◽

...

Keyword(s):

Atomic Force Microscope ◽

Molecular Wire ◽

Atomic Force

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Determination of the creep function using atomic force microscope

Materials Letters ◽

10.1016/j.matlet.2019.126872 ◽

2020 ◽

Vol 259 ◽

pp. 126872

Author(s):

Alexander P. Kren ◽

Alexander S. Machikhin ◽

Marat F. Bulatov

Keyword(s):

Atomic Force Microscope ◽

Creep Function ◽

Atomic Force

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Determination of Mechanical Properties of Polymer Interphase Using Combined Atomic Force Microscope (AFM) Experiments and Finite Element Simulations

Macromolecules ◽

10.1021/acs.macromol.8b01427 ◽

2018 ◽

Vol 51 (20) ◽

pp. 8229-8240 ◽

Cited By ~ 4

Author(s):

Min Zhang ◽

Yang Li ◽

Pavan V. Kolluru ◽

L. Catherine Brinson

Keyword(s):

Mechanical Properties ◽

Finite Element ◽

Atomic Force Microscope ◽

Finite Element Simulations ◽

Atomic Force

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Determination of the nonlinearity of capacitive sensors along the Z-axis of an atomic force microscope

Measurement Techniques ◽

10.1007/s11018-013-0194-1 ◽

2013 ◽

Vol 56 (3) ◽

pp. 275-277

Author(s):

A. V. Zablotskii ◽

V. A. Sharonov ◽

V. S. Bormashov ◽

A. S. Baturin ◽

P. A. Todua

Keyword(s):

Atomic Force Microscope ◽

Capacitive Sensors ◽

Atomic Force

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Plasticity of diamond at room temperature and determination of its hardness using an atomic force microscope with an ultrahard C60 fullerite tip

Technical Physics Letters ◽

10.1134/1.1261819 ◽

1997 ◽

Vol 23 (7) ◽

pp. 546-547 ◽

Cited By ~ 2

Author(s):

V. D. Blank ◽

M. Yu. Popov ◽

N. A. L’vova ◽

K. V. Gogolinskii ◽

V. N. Reshetov

Keyword(s):

Atomic Force Microscope ◽

Room Temperature ◽

Atomic Force

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Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscope

Ultramicroscopy ◽

10.1016/s0304-3991(02)00338-8 ◽

2003 ◽

Vol 94 (3-4) ◽

pp. 283-291 ◽

Cited By ~ 5

Author(s):

S.T. Huntington ◽

P.G. Hartley ◽

J. Katsifolis

Keyword(s):

Atomic Force Microscope ◽

Evanescent Wave ◽

Surface Force ◽

Wave Optics ◽

Absolute Distance ◽

Force Measurements ◽

Atomic Force

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Determination of the V function for CR-39 by atomic force microscope

Recent Advances in Multidisciplinary Applied Physics ◽

10.1016/b978-008044648-6/50006-9 ◽

2005 ◽

pp. 29-34 ◽

Cited By ~ 1

Author(s):

K YU ◽

J HO ◽

D NIKEZIC ◽

C YIP

Keyword(s):

Atomic Force Microscope ◽

Atomic Force

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Determination of texture properties of banana fruit cells with an atomic force microscope: A case study on elastic modulus and stiffness

Journal of Texture Studies ◽

10.1111/jtxs.12594 ◽

2021 ◽

Author(s):

Rasool Khodabakhshian ◽

Asal Naeemi ◽

Mohammad Reza Bayati

Keyword(s):

Elastic Modulus ◽

Atomic Force Microscope ◽

Banana Fruit ◽

Texture Properties ◽

Atomic Force

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Determination of the Elastic Properties of Tomato Fruit Cells with an Atomic Force Microscope

Sensors ◽

10.3390/s130912175 ◽

2013 ◽

Vol 13 (9) ◽

pp. 12175-12191 ◽

Cited By ~ 42

Author(s):

Artur Zdunek ◽

Andrzej Kurenda

Keyword(s):

Atomic Force Microscope ◽

Elastic Properties ◽

Tomato Fruit ◽

Atomic Force

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Surface chemical analysis � Scanning probe microscopy � Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

10.3403/30351708u ◽

2020 ◽

Keyword(s):

Chemical Analysis ◽

Atomic Force Microscope ◽

Scanning Probe Microscopy ◽

Elastic Moduli ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Atomic Force ◽

Surface Chemical Analysis

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