Retraction notice to "Investigation of plasmonic studies on morphology of deposited silver thin films having different thicknesses by soft computing methodologies—A comparativestudy" [ Physica E 63 (2014) 317–323]

Author(s):  
Rozalina Zakaria ◽  
Siti Munirah Che Noh ◽  
Dalibor Petković ◽  
Shahaboddin Shamshirband ◽  
Richard Penny
2018 ◽  
Vol 159 ◽  
pp. 414 ◽  
Author(s):  
Shahaboddin Shamshirband ◽  
Dalibor Petković ◽  
Hadi Saboohi ◽  
Nor Badrul Anuar ◽  
Irum Inayat ◽  
...  

2017 ◽  
Vol 193 ◽  
pp. 81-84 ◽  
Author(s):  
Yong-Seok Lee ◽  
Gi-Dong Sim ◽  
Jong-Soo Bae ◽  
Ji-Young Kim ◽  
Soon-Bok Lee

1991 ◽  
Vol 239 ◽  
Author(s):  
J. Ruud ◽  
D. Josell ◽  
A. L. Greer ◽  
F. Spaepen

ABSTRACTA new design for a thin film microtensile tester is presented. The strain is measured directly on the free-standing thin film from the displacement of laser spots diffracted from a thin grating applied to its surface by photolithography. The diffraction grating is two-dimensional, allowing strain measurement both along and transverse to the tensile direction. In principle, both Young's modulus and Poisson's ratio of a thin film can be determined. Ag thin films with strong <111> texture were tested. The measured Young moduli agreed with those measured on bulk crystals, but the measured Poisson ratios were low, most likely due to slight transverse folding of the film that developed during the test.


2000 ◽  
Vol 12 (17) ◽  
pp. 4125-4139 ◽  
Author(s):  
A Da Silva ◽  
C Andraud ◽  
J Lafait ◽  
A Dakka

2000 ◽  
Vol 371 (1-2) ◽  
pp. 17-27 ◽  
Author(s):  
I. Tomov ◽  
M. Adamik ◽  
P.B. Barna

2014 ◽  
Vol 22 ◽  
pp. 28-36 ◽  
Author(s):  
N.M. Shinde ◽  
A.C. Lokhande ◽  
J.S. Bagi ◽  
C.D. Lokhande

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