Critical current density measurement of thin films by AC susceptibility based on the penetration parameter h
2012 ◽
Vol 477
◽
pp. 6-14
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1993 ◽
Vol 64
(8)
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pp. 2385-2386
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1997 ◽
Vol 10
(12)
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pp. 955-958
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1991 ◽
Vol 49
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pp. 1080-1081
Keyword(s):
2010 ◽
Vol 470
◽
pp. S972-S974
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1999 ◽
Vol 13
(13)
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pp. 1645-1654
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2005 ◽
Vol 15
(2)
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pp. 3046-3049
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1995 ◽
Vol 250
(1-2)
◽
pp. 55-58
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