Lateral critical current density distributions degraded near edges of coated conductors through cutting processes and their influence on ac loss characteristics of power transmission cables

2011 ◽  
Vol 471 (21-22) ◽  
pp. 990-994 ◽  
Author(s):  
N. Amemiya ◽  
Q. Li ◽  
R. Nishino ◽  
K. Takeuchi ◽  
T. Nakamura ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Power Transmission ◽  
Coated Conductors ◽  
Ac Loss ◽  
Density Distributions ◽  
Cutting Processes

Strongly coupled critical current density values achieved in Y1Ba2Cu3O7−δ coated conductors with near-single-crystal texture

2003 ◽  
Vol 82 (25) ◽  
pp. 4519-4521 ◽  
Author(s):  
S. R. Foltyn ◽  
P. N. Arendt ◽  
Q. X. Jia ◽  
H. Wang ◽  
J. L. MacManus-Driscoll ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Single Crystal ◽  
Critical Current ◽  
Current Density ◽  
Coated Conductors ◽  
Strongly Coupled ◽  
Crystal Texture ◽  
Density Values

Reconstruction of critical current density profiles from AC loss measurements

1998 ◽  
Vol 310 (1-4) ◽  
pp. 173-176 ◽  
Author(s):  
A.A. Kordyuk ◽  
V.V. Nemoshkalenko ◽  
R.V. Viznichenko ◽  
W. Gawalek
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Ac Loss ◽  
Density Profiles

Fabrication of High Jc YBa2Cu3O7-δ Coated Conductors Using Sol-Gel Buffer Layers On Nickel and Nickel Alloy Substrates

2001 ◽  
Vol 689 ◽  
Author(s):  
S. Sathyamurthy ◽  
M. Paranthaman ◽  
B. W. Kang ◽  
H. Y. Zhai ◽  
T. Aytug ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Sol Gel ◽  
Rf Sputtering ◽  
Cube Texture ◽  
Dip Coating ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Ybco Films

Sol-gel processing of La2Zr2O7 (LZO) buffer layers on biaxially textured Ni-3 at.% W alloy substrates using a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. The effect of increasing the annealing speed on the texture, microstructure and the carbon content retained in the film were studied. On top of the LZO films, epitaxial layers of Yttria Stabilized Zirconia (YSZ) and Ceria (CeO2) were deposited using rf sputtering, and YBa2Cu3Ox (YBCO) films were then deposited using Pulsed Laser Deposition (PLD). A critical current density (Jc) of 1.9 MA/cm2 at 77K and self-field and 0.34 MA/cm2 at 77K and 0.5T have been obtained on these films. These values are comparable to those obtained on YBCO films deposited on all-vacuum deposited buffer layers, and are the highest ever obtained using solution seed layers. The use of all-solution buffers for coated conductor processing has also been explored. A critical current density of 1.1 MA/cm2 at 77 K and self-field was obtained on YBCO films grown be PLD on LZO buffered nickel substrates.

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