Synthesis and characterization of BaZrO3-doped YBa2Cu3O7−δ microtapes with improved critical current densities

2010 ◽  
Vol 470 (7-8) ◽  
pp. 373-377 ◽  
Author(s):  
Stuart C. Wimbush ◽  
Dominic Walsh ◽  
Simon R. Hall
2014 ◽  
Vol 975 ◽  
pp. 106-110
Author(s):  
Natacha Andréia Nogueira ◽  
Anne Hitome Yonamine ◽  
Dayse Iara dos Santos ◽  
Jung Ho Kim ◽  
Shi Xue Dou

The addition of two compounds, calcium silicate and calcium zirconate was tested, in the preparation of Bi: 2212 silver sheathed wires by powder-in-tube method, which were successfully tested previously in processing chips. The wires were treated in an atmosphere of O2/Ar using partial melting method. The characterizations were structural and on their electrical and magnetic properties. As the results, transition temperatures were higher than the expected for this stage, ranged from 105K (BSCCO880) to 116K (+Si883). The critical current densities encountered in transport and magnetization measurements were improved in comparison with the wires without addition.


Author(s):  
I-Fei Tsu ◽  
D.L. Kaiser ◽  
S.E. Babcock

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.


1996 ◽  
Vol 61 (10) ◽  
pp. 3572-3572
Author(s):  
Lawrence T. Scott ◽  
Atena Necula

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.


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