XRD and TEM studies of as-grown MgB2 thin films deposited on r- and c-plane sapphire substrates

2004 ◽  
Vol 412-414 ◽  
pp. 1366-1370 ◽  
Author(s):  
A. Saito ◽  
H. Shimakage ◽  
A. Kawakami ◽  
Z. Wang ◽  
K. Kuroda ◽  
...  
Keyword(s):  
Thin Films ◽  
Sapphire Substrates ◽  
Mgb2 Thin Films ◽  
Xrd And Tem

HALL EFFECT, MAGNETORESISTIVITY AND MAGNETIC PROPERTIES OF MgB2 THIN FILMS WITH AlN BUFFER LAYERS

2008 ◽  
Vol 22 (08) ◽  
pp. 991-996
Author(s):  
G. ILONCA ◽  
T. R. YANG ◽  
A. V. POP ◽  
P. BALINT ◽  
M. BODEA ◽  
...  
Keyword(s):  
Thin Films ◽  
Upper Critical Field ◽  
Buffer Layers ◽  
Temperature Dependent ◽  
Sapphire Substrates ◽  
Anisotropic Coefficient ◽  
Aln Buffer ◽  
Mgb2 Thin Films ◽  
Sputtering System

MgB 2 thin films were deposited at low temperature substrates, in situ, on c-plane sapphire substrates, with the aluminium nitride (AlN) buffer layers, using the multiple-target sputtering system. The magnetoresistivities were measured using dc-five probe method in applied magnetic field up to 9 Tesla. The upper critical field anisotropy, HC2(T) and irreversibility field H irr (T) versus temperature were determined. The Hall coefficients RH are slightly temperature dependent and positive in the normal state. The critical temperature of 30–32 K and critical current density of 106-107 A/cm 2 at 4.2 K were obtained. Using extracted data, the coherence length ξo, anisotropic coefficient γ and penetration depth λL were calculated.

Effects of surface damage on critical current density in MgB2 thin films

2021 ◽  
Vol 22 ◽  
pp. 14-19
Author(s):  
Soon-Gil Jung ◽  
Duong Pham ◽  
Jung Min Lee ◽  
Yoonseok Han ◽  
Won Nam Kang ◽  
...  
Keyword(s):  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Surface Damage ◽  
Mgb2 Thin Films

Characterization of the order-annealing response of nanostructured iron-palladium based ferromagnetic thin-films

2001 ◽  
Vol 703 ◽  
Author(s):  
Huiping Xu ◽  
Adam T. Wise ◽  
Timothy J. Klemmer ◽  
Jörg M. K. Wiezorek
Keyword(s):  
Thin Films ◽  
Grain Growth ◽  
Room Temperature ◽  
Si Substrate ◽  
Ferromagnetic Thin Films ◽  
Precipitation Reactions ◽  
Post Deposition ◽  
Xrd And Tem ◽  
Iron Palladium

ABSTRACTA combination of XRD and TEM techniques have been used to characterize the response of room temperature magnetron sputtered Fe-Pd thin films on Si-susbtrates to post-deposition order-annealing at temperatures between 400-500°C. Deposition produced the disordered Fe-Pd phase with (111)-twinned grains approximately 18nm in size. Ordering occurred for annealing at 450°C and 500°C after 1.8ks, accompanied by grain growth (40-70nm). The ordered FePd grains contained (111)-twins rather than {101}-twins typical of bulk ordered FePd. The metallic overlayers and underlayers selected here produced detrimental dissolution (Pt into Fe-Pd phases) and precipitation reactions between Pd and the Si substrate.

Properties of Nb3Al Thin Films Sputter-Deposited on Sapphire Substrates

1982 ◽  
Vol 21 (Part 1, No. 10) ◽  
pp. 1427-1430 ◽  
Author(s):  
Keiichi Tanabe ◽  
Osamu Michikami
Keyword(s):  
Thin Films ◽  
Sapphire Substrates ◽  
Sputter Deposited

MgB2 Thin Films on Metal Substrates for Superconducting RF Cavity Applications

2013 ◽  
Vol 26 (5) ◽  
pp. 1563-1568 ◽  
Author(s):  
Chenggang Zhuang ◽  
Teng Tan ◽  
Alex Krick ◽  
Qingyu Lei ◽  
Ke Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Metal Substrates ◽  
Rf Cavity ◽  
Superconducting Rf ◽  
Mgb2 Thin Films

Heteroepitaxy, polymorphism, and faulting in GaN thin films on silicon and sapphire substrates

1993 ◽  
Vol 74 (7) ◽  
pp. 4430-4437 ◽  
Author(s):  
T. Lei ◽  
K. F. Ludwig ◽  
T. D. Moustakas
Keyword(s):  
Thin Films ◽  
Sapphire Substrates

MgB2 thin films grown on graphene/Ni–Mo alloy system

2015 ◽  
Vol 516 ◽  
pp. 27-30
Author(s):  
Kehuan Linghu ◽  
Qingjun Song ◽  
Huai Zhang ◽  
QianQian Yang ◽  
Jibo Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Alloy System ◽  
Mgb2 Thin Films

Growth of corundum-structured In2O3 thin films on sapphire substrates with Fe2O3 buffer layers

2013 ◽  
Vol 364 ◽  
pp. 30-33 ◽  
Author(s):  
Norihiro Suzuki ◽  
Kentaro Kaneko ◽  
Shizuo Fujita
Keyword(s):  
Thin Films ◽  
Buffer Layers ◽  
Sapphire Substrates
Sign in / Sign up

Export Citation Format

Share Document