Frequency and voltage dependence of electrical and dielectric properties in metal-interfacial layer-semiconductor (MIS) type structures

2020 ◽  
Vol 587 ◽  
pp. 412122 ◽  
Author(s):  
Ömer Sevgili ◽  
Yashar Azizian-Kalandaragh ◽  
Şemsettin Altındal
Keyword(s):  
Dielectric Properties ◽  
Interfacial Layer ◽  
Voltage Dependence ◽  
Electrical And Dielectric Properties ◽  
Frequency And Voltage Dependence

Temperature and Interfacial Layer Effects on the Electrical and Dielectric Properties of Al/(CdS-PVA)/p-Si (MPS) Structures

2018 ◽  
Vol 47 (11) ◽  
pp. 6600-6606 ◽  
Author(s):  
Gülçin Ersöz Demir ◽  
İbrahim Yücedağ ◽  
Yashar Azizian-Kalandaragh ◽  
Şemsettin Altındal
Keyword(s):  
Dielectric Properties ◽  
Interfacial Layer ◽  
Electrical And Dielectric Properties

Frequency and Voltage Dependence of the Dielectric Properties of Ni/SiO2/P-Si (MOS) Structure

Silicon ◽  
2019 ◽  
Vol 12 (8) ◽  
pp. 1879-1885 ◽  
Author(s):  
Ragab Mahani ◽  
A. Ashery ◽  
Mohamed M. M. Elnasharty
Keyword(s):  
Dielectric Properties ◽  
Voltage Dependence ◽  
Mos Structure ◽  
Frequency And Voltage Dependence
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