Dependence on accelerating voltage of crystal structural changes in water ice thin film under electron beam irradiation

2013 ◽  
Vol 411 ◽  
pp. 88-92
Author(s):  
Keita Kobayashi ◽  
Hidehiro Yasuda
Keyword(s):  
Thin Film ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Structural Changes ◽  
Beam Irradiation ◽  
Water Ice ◽  
Crystal Structural

Twinning and oxygen ordering in Ba2YCu3O7−x crystals

1990 ◽  
Vol 48 (4) ◽  
pp. 14-15
Author(s):  
Sumio Iijima ◽  
Toshinari Ichihashi
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Structural Changes ◽  
Oxygen Deficiency ◽  
Phase 1 ◽  
Structural Evolution ◽  
Beam Irradiation ◽  
Oxygen Ordering ◽  
Tweed Structure ◽  
T Phase

Formation of twins in Or-BYCO crystals was studied by transforming them to T-phase by electron beam irradiation in the microscope. It is known that during the transformation the crystals developed twinning (STW), Ortho-II phase (1×2 superstructure), tweed structure. These structures occur in that order by the irradiation and the structural changes are caused by oxygen deficiency and oxygen atoms ordering. This work is aimed at elucidation of oxygen atom ordering by examining the structural evolution in terms of morphologies of the twins.Atypical evolution of an Or-BYCO crystal is shown in a series of micrographs in Figs. 1 to 5. As-grown twin (FTW) boundaries have a characteristic lens shape extending in the < 110> direction and terminate at a twin boundary in horizontal direction (Fig.1). These boundaries don't accompany strain contrast which is developed in the crystal after a brief irradiation (Fig.2). The strain contrasts, which are differentiated easily from the thickness contrast, appear parallel to the boundaries and change slowly across the boundaries.

Compositional and Structural Changes of Corn Cob Pretreated by Electron Beam Irradiation

2016 ◽  
Vol 5 (1) ◽  
pp. 420-425 ◽  
Author(s):  
Xiaoya Guo ◽  
Ting Zhang ◽  
Sitao Shu ◽  
Wei Zheng ◽  
Mintian Gao
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Structural Changes ◽  
Beam Irradiation ◽  
Corn Cob

Effects of Electron Beam Irradiation on PZT/PLZT Thin Film Capacitors

1994 ◽  
Vol 361 ◽  
Author(s):  
Bo Jiang ◽  
Jiyoung Kim ◽  
Rajesh Khamankar ◽  
Insup Lee ◽  
Jack C. Lee
Keyword(s):  
Thin Film ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Hysteresis Loops ◽  
Damage Mechanism ◽  
Charge Carriers ◽  
Beam Irradiation ◽  
Thin Film Capacitors ◽  
Domain Boundaries ◽  
Original Domain

ABSTRACTThe effects of electron beam irradiation on the electrical characteristics of Pt-PZT-Pt and Pt-PLZT-Pt (with La concentration of 5% and 10%) thin film capacitors were studied. The top electrode of each capacitor was bombarded by localized energetic electrons with incident energies varying from 5 keV to 25 ke.V. Large distortions in the hysteresis loops were observed when the incident electrons had enough energy to penetrate the 1000Å Pt top electrode. The damage effects are strongly dependent on the original domain orientation when the film is irradiated, and an applied a.c. field after the irradiation seems to induce some recovery effects. The damage mechanism is explained by a simple model which considers the effect of space charge fields generated by the charge carriers trapped at the domain boundaries.

Sign in / Sign up

Export Citation Format

Share Document