Degradation analysis of thin film photovoltaic modules

2009 ◽  
Vol 404 (22) ◽  
pp. 4449-4451 ◽  
Author(s):  
C. Radue ◽  
E.E. van Dyk
Keyword(s):  
Thin Film ◽  
Photovoltaic Modules ◽  
Degradation Analysis

scholarly journals Degradation analysis of thin film photovoltaic modules under outdoor long term exposure in Spanish continental climate conditions

Solar Energy ◽  
2016 ◽  
Vol 139 ◽  
pp. 599-607 ◽  
Author(s):  
Santiago Silvestre ◽  
Sofiane Kichou ◽  
Letizia Guglielminotti ◽  
Gustavo Nofuentes ◽  
Miguel Alonso-Abella
Keyword(s):  
Thin Film ◽  
Climate Conditions ◽  
Photovoltaic Modules ◽  
Degradation Analysis ◽  
Continental Climate

scholarly journals Analysis of thin film photovoltaic modules under outdoor long term exposure in semi-arid climate conditions

Solar Energy ◽  
2017 ◽  
Vol 157 ◽  
pp. 587-595 ◽  
Author(s):  
Ali Tahri ◽  
Santiago Silvestre ◽  
Fatima Tahri ◽  
Soumia Benlebna ◽  
Aissa Chouder
Keyword(s):  
Thin Film ◽  
Arid Climate ◽  
Climate Conditions ◽  
Photovoltaic Modules ◽  
Semi Arid

A novel approach for the recycling of thin film photovoltaic modules

2010 ◽  
Vol 54 (10) ◽  
pp. 711-718 ◽  
Author(s):  
Wolfgang Berger ◽  
Franz-Georg Simon ◽  
Karin Weimann ◽  
Erik A. Alsema
Keyword(s):  
Thin Film ◽  
Photovoltaic Modules ◽  
Novel Approach

scholarly journals Mechanical Degradation Analysis of an Amorphous Silicon Solar Module

Energies ◽  
2020 ◽  
Vol 13 (16) ◽  
pp. 4126
Author(s):  
Gilbert Osayemwenre ◽  
Edson Meyer
Keyword(s):  
Solar Cells ◽  
Amorphous Silicon ◽  
Adhesion Force ◽  
Structural Defects ◽  
Mechanical Degradation ◽  
Solar Module ◽  
Photovoltaic Modules ◽  
Degradation Analysis ◽  
Defective Region

This work examines the degradation of photovoltaic modules. It assesses the structural defects of amorphous silicon solar cells, which result from mechanical stress at nanoscale level. Firstly, it analyses the interface morphology, deformation, and internal delamination of a single junction amorphous silicon solar module. Secondly, it explores the interface deformation of the layers of the defective region of the module with some statistical tools including root mean root (RSM) and arithmetic mean (Rq). It used the aforementioned tools to demonstrate the effect of microstructural defects on the mechanical behaviour of the entire layers of the module. The study established that the defect observed in the module, emanated from long-term degradation of the a-Si solar cells after years of exposure to various light and temperature conditions. It tested the mechanism of mechanical degradation and its effect on the reliability and stability of the defective and non-defective regions of the module with adhesion force characterisation.

scholarly journals Behavioral data of thin-film single junction amorphous silicon (a-Si) photovoltaic modules under outdoor long term exposure

Data in Brief ◽  
2016 ◽  
Vol 7 ◽  
pp. 366-371 ◽  
Author(s):  
Sofiane Kichou ◽  
Santiago Silvestre ◽  
Gustavo Nofuentes ◽  
Miguel Torres-Ramírez ◽  
Aissa Chouder ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Behavioral Data ◽  
Single Junction ◽  
Photovoltaic Modules
Sign in / Sign up

Export Citation Format

Share Document