Electrical and magnetic properties of Mn-doped Si thin films

2009 ◽  
Vol 404 (12-13) ◽  
pp. 1686-1688 ◽  
Author(s):  
T.T. Lan Anh ◽  
S.S. Yu ◽  
Y.E. Ihm ◽  
D.J. Kim ◽  
H.J. Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Electrical And Magnetic Properties ◽  
Mn Doped

Ferro-electric and magnetic properties in Bi5Ti3FeO15 films by Mn-doping

2021 ◽  
Author(s):  
Xue Zhang ◽  
Ruijuan Qi ◽  
Shangwei Dong ◽  
Shuai Yang ◽  
Xuekun Hong ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Cell Volume ◽  
Unit Cell Volume ◽  
Unit Cell ◽  
Mn Doping ◽  
Electrical And Magnetic Properties ◽  
Mn Doped

We investigate the structure and optical, electrical and magnetic properties in Mn-doped Bi5Ti3FeO15 (BTFO) thin films. While Mn-doping does not almost change the structure and unit cell volume of BTFO,...

Effect of Substrate Variation on Electrical and Magnetic Properties of Mn Doped ZnO of Dilute Magnetic Semiconductors

2005 ◽  
Vol 891 ◽  
Author(s):  
Srikanth Manchiraju ◽  
Govind Mundada ◽  
Ted Kehl ◽  
Craig Vera ◽  
Rishi Patel ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Single Crystal ◽  
Magnetic Semiconductors ◽  
Dilute Magnetic Semiconductors ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electrical And Magnetic Properties ◽  
Quartz Substrates ◽  
Mn Doped

ABSTRACTIn this paper, the effect of substrate on the domain structure growth and electrical and magnetic properties of epitaxial Mn-doped Zn0.8Mn0.15O (ZnMnO) thin films has been investigated. Epitaxial thin films of ZnMnO dilute magnetic semiconductors (DMS) were grown on various substrates such as single crystal sapphire, single crystal silicon, and quartz substrates using Pulsed Laser Deposition (PLD) technique . Structural, surface, magnetic, and optical properties have been observed on these films using X-Ray diffraction (XRD), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), and Raman spectroscopy. X-Ray Diffraction shows that films are highly epitaxial and c-axis oriented with some induced strain. AFM images show that film surface is smooth with RMS roughness of the order of 1-2 nm over 5*5sq.micron. Magnetic characteristic properties such as carrier concentration, mobility, and temperature dependent resistivity were also investigated. Carrier concentration decreases and mobility increases for both the films on silicon and quartz substrates when compared to film on sapphire.

Percolation Effects in the Mechanical Properties of Granular Ni-A12O3 thin films

1990 ◽  
Vol 195 ◽  
Author(s):  
T.E. Schlesinger ◽  
A. Gavrin ◽  
R.C. Cammarata ◽  
C.-L. Chien
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Plastic Deformation ◽  
Magnetic Properties ◽  
Percolation Threshold ◽  
Volume Fraction ◽  
Electrical And Magnetic Properties ◽  
Low Load

ABSTRACTThe mechanical properties of sputtered Ni-Al2O3 granular thin films were investigated by low load microharaness testing. It was found that the microhardness of these films displayed a percolation threshold at a nickel volume fraction of about 0.6, below which the hardness is greatly enhanced. This behavior is qualitatively similar to the electrical and magnetic properties of these types of films. A percolation threshold in hardness can be understood as due to a change in the mechanism for plastic deformation.

Optical and magnetic properties of Mn doped ZnO thin films grown by SILAR method

2012 ◽  
Vol 24 (6) ◽  
pp. 1782-1787 ◽  
Author(s):  
S. Balamurali ◽  
R. Chandramohan ◽  
N. Suriyamurthy ◽  
P. Parameswaran ◽  
M. Karunakaran ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Zno Thin Films ◽  
Silar Method ◽  
Optical And Magnetic Properties ◽  
Doped Zno ◽  
Mn Doped
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