Compositional dependence of the optical properties of the amorphous GexTe1−x system

2008 ◽  
Vol 403 (18) ◽  
pp. 2949-2955 ◽  
Author(s):  
N. El-Kabany
2004 ◽  
Vol 201 (10) ◽  
pp. 2312-2318 ◽  
Author(s):  
N. Muthukumarasamy ◽  
R. Balasundaraprabhu ◽  
S. Jayakumar ◽  
M. D. Kannan ◽  
P. Ramanathaswamy

2013 ◽  
Vol 44 ◽  
pp. 130-141 ◽  
Author(s):  
Kiril Petkov ◽  
Jordanka Tasseva ◽  
Venceslav Vassilev ◽  
Lilia Aljihmani

2016 ◽  
Vol 93 (12) ◽  
Author(s):  
Chi Xu ◽  
J. D. Gallagher ◽  
C. L. Senaratne ◽  
J. Menéndez ◽  
J. Kouvetakis

2013 ◽  
Vol 377 ◽  
pp. 186-190 ◽  
Author(s):  
J.M. Conde Garrido ◽  
A. Piarristeguy ◽  
M.A. Ureña ◽  
M. Fontana ◽  
B. Arcondo ◽  
...  

2002 ◽  
Vol 744 ◽  
Author(s):  
Matthew R. Bauer ◽  
John Tolle ◽  
A. V. G. Chizmeshya ◽  
S. Zollner ◽  
J. Menendez ◽  
...  

ABSTRACTThe synthesis and optical properties of a new class of Si-based infrared semiconductors in the Ge1-x Snx system are described. Chemical methods based on deuterium-stabilized Sn hydrides and UHV-CVD were used to prepare a wide range of metastable compositions and structures directly on silicon. These materials exhibit high thermal stability, superior crystallinity, and unique crystallographic and optical properties, such as adjustable band gaps and lattice constants. These properties are characterized by Rutherford backscattering, low-energy secondary ion mass spectrometry, high-resolution transmission electron microscopy, x-ray diffraction as well as infrared and Raman spectroscopies and spectroscopic ellipsometry. The films grow essentially strain free and display a strong compositional dependence of the band structure.


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