Effect of electron correlation near-field-induced SDW on angle dependent magnetoresistance oscillation

2006 ◽  
Vol 378-380 ◽  
pp. 1051-1053
Author(s):  
Hirono Kaneyasu ◽  
Keita Kishigi ◽  
Yasumasa Hasegawa
Keyword(s):  
Electron Correlation ◽  
Near Field ◽  
Magnetoresistance Oscillation

To What Extent are Inelastically Scattered Electrons Useful in the Stem?

1973 ◽  
Vol 31 ◽  
pp. 286-287 ◽  
Author(s):  
H. Rose
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Electron Correlation ◽  
Quantum Noise ◽  
Collection Efficiency ◽  
Scanning Transmission Electron Microscope ◽  
Electron Cloud ◽  
Scanning Time ◽  
Transmission Electron ◽  
Scanning Transmission

The scanning transmission electron microscope offers the possibility of utilizing inelastically scattered electrons. Use of these electrons in addition to the elastically scattered electrons should reduce the scanning time (dose) Which is necessary to keep the quantum noise below a certain level. Hence it should lower the radiation damage. For high resolution, Where the collection efficiency of elastically scattered electrons is small, the use of Inelastically scattered electrons should become more and more favorable because they can all be detected by means of a spectrometer. Unfortunately, the Inelastic scattering Is a non-localized interaction due to the electron-electron correlation, occurring predominantly at the circumference of the atomic electron cloud.

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Principles of Planar Near-Field Antenna Measurements

2007 ◽  
Author(s):  
Stuart Gregson ◽  
John McCormick ◽  
Clive Parini
Keyword(s):  
Near Field ◽  
Antenna Measurements

ELECTRON CORRELATION IN METALS EVIDENCED BY COMPTON SCATTERING

1987 ◽  
Vol 48 (C9) ◽  
pp. C9-851-C9-854 ◽  
Author(s):  
A. ISSOLAH ◽  
j. CHOMILIER ◽  
Y. GARREAU ◽  
G. LOUPIAS
Keyword(s):  
Compton Scattering ◽  
Electron Correlation

Immobilization of Radionuclides on Iron Canister Material at Simulated Near-field Conditions

2008 ◽  
Author(s):  
Daqing Cui ◽  
Ylva Ranebo ◽  
Jeanett Low ◽  
Vincenzo Rondinella ◽  
Jinshan Pan ◽  
...  
Keyword(s):  
Near Field ◽  
Field Conditions
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