Minor hysteresis loops measurements for characterization of cast iron

2006 ◽  
Vol 372 (1-2) ◽  
pp. 156-159 ◽  
Author(s):  
G. Vértesy ◽  
T. Uchimoto ◽  
T. Takagi ◽  
I. Tomáš ◽  
O. Stupakov ◽  
...  
Author(s):  
David M. Pisani ◽  
John A. Gallagher ◽  
Benjamin Smith-Stewart ◽  
Christopher S. Lynch

Macro fiber composites (MFCs) are used in applications ranging from sensing and actuation to energy harvesting and piezoelectric damping. MFCs are comprised of interdigitated electrodes (IDEs) on ferroelectric fibers that result in anisotropic in plane sensing and actuation capability. Minor hysteresis loops were measured for a MFC and the area within the minor hysteresis loops was used to assess material loss under unipolar cyclic loading. A separate set of minor hysteresis loops was run on a fully electroded plate of the same material to determine the material loss when the electric field was uniform. The MFC displayed considerably more material loss than the uniformly loaded plate. A micromechanical model implemented in a finite element code was used to model the effect of inhomogeneous fields, local stress, and polarization reorientation on the dielectric losses. The results indicate that the development of local stress in the ferroelectric material beneath the inerdigitated electrodes results in ferroelastic polarization reorientation that contributes to dielectric losses.


2020 ◽  
Vol 57 (10) ◽  
pp. 714-742
Author(s):  
V. G. Efremenko ◽  
K. M. Wu ◽  
K. Shimizu ◽  
I. Petryshynets ◽  
B. V. Efremenko ◽  
...  

2019 ◽  
Vol 22 (2) ◽  
pp. 569-577 ◽  
Author(s):  
Satnam Singh ◽  
Praveen Singh ◽  
Dheeraj Gupta ◽  
Vivek Jain ◽  
Rohit Kumar ◽  
...  
Keyword(s):  

2012 ◽  
Vol 523-524 ◽  
pp. 961-966
Author(s):  
Hideaki Tanaka ◽  
Yukio Maeda

Magnetic recording technologies are continuing to advance toward higher areal densities, driven by the availability of tunneling magnetoresistive (TMR) heads. However, high areal density heads require smaller physical dimensions, and this can render TMR heads more vulnerable to mechanical stresses generated during the lapping process. Although is important to verify the durability of TMR heads against lapping, it is very difficult to perform a crystallographic analysis of the affected layer because of the small dimensions involved. In this study, we attempted to establish an advanced TMR head verification method based on a magnetic performance analysis involving micro-Kerr hysteresis loops and the magnetic noise spectrum. We found that the magnetic performance changed when nanoscale scratches were removed from the lapped surface using ion beam etching. This indicates that the lapping process produces an affected layer which deteriorates the magnetic characteristics of the TMR head. A correlation was also found between the change in magnetic performance and the morphology of lapped surface.


2008 ◽  
Vol 1071 ◽  
Author(s):  
Koji Aizawa

AbstractCharacterization of 700-nm-thick poly(vinylidene fluoride/trifluoroethylene) [P(VDF/TrFE)]/TiO2/Al-doped ZnO (AZO) structures on a glass substrate were investigated. In this study, the sputtered TiO2 films as insulator were used for the reduction of leakage current. The leakage current density of the fabricated Pt/P(VDF/TrFE)/AZO and Pt/P(VDF/TrFE)/170-nm-thick TiO2/AZO structures were approximately 8.7 and 3.9 nA/cm2 at the applied voltage of 10 V, respectively. In the polarization vs. voltage characteristics, the fabricated Pt/P(VDF/TrFE)/TiO2/AZO structures showed hysteresis loops caused by ferroelectric polarization. The remnant polarization (2Pr) and coercive voltage (2Vc) measured from a saturated hysteresis loop at the frequency of 50 Hz were approximately 12 μC/cm2 and 105 V, respectively. These results suggest that the insertion of TiO2 film is available for reducing the gate leakage current without changing the ferroelectric properties.


Author(s):  
Ricardo de A. Elias ◽  
Carlos A. C. Wengerkievicz ◽  
Guilherme H. Souza Reis ◽  
Nelson Sadowski ◽  
Nelson J. Batistela ◽  
...  

2013 ◽  
Vol 19 (S2) ◽  
pp. 1110-1111
Author(s):  
S.A. Wight ◽  
J.R. Hitchings
Keyword(s):  
X Ray ◽  

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.


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