Trapping center parameters of TlGaSe2 layered crystals

2004 ◽  
Vol 344 (1-4) ◽  
pp. 249-254 ◽  
Author(s):  
N.S. Yuksek ◽  
H. Kavas ◽  
N.M. Gasanly ◽  
H. Ozkan
Keyword(s):  
Trapping Center ◽  
Layered Crystals

DETERMINATION OF TRAPPING CENTER PARAMETERS OF Tl2Ga2S3Se LAYERED CRYSTALS BY THERMALLY STIMULATED CURRENT MEASUREMENTS

2010 ◽  
Vol 24 (14) ◽  
pp. 2149-2161 ◽  
Author(s):  
T. YILDIRIM ◽  
H. A. NASSER ◽  
N. M. GASANLY
Keyword(s):  
Cross Section ◽  
Trapping Center ◽  
Heating Rates ◽  
Thermally Stimulated Current ◽  
A Value ◽  
Initial Rise ◽  
Layered Crystals ◽  
Light Excitation ◽  
Good Agreement

We have carried out thermally stimulated current (TSC) measurements on as-grown Tl 2 Ga 2 S 3 Se layered single crystals in the temperature range 10–60 K with different heating rates of 0.6–1.5 K s1. The data were analyzed by curve fitting, initial rise, and peak shape methods. The results were in good agreement with each other. Experimental evidence was obtained for trapping center in Tl 2 Ga 2 S 3 Se crystal with activation energy of 11 meV. The capture cross section and concentration of the traps were found to be 1.5 × 10-23 cm 2 and 1.44 × 1010 cm -3, respectively. Analysis of the TSC data at different light excitation temperatures leads to a value of 18meV/decade for the traps distribution.

Mosaic Mapping: A Means of Tiling Images to Shorten Acquisition Speed for Lower - Magnification SEM Images and Wavelength Dispersive Spectrometers (WDS) X-Ray Maps

1996 ◽  
Vol 54 ◽  
pp. 438-439
Author(s):  
J.D. Geller ◽  
C.R. Herrington
Keyword(s):  
Limiting Factors ◽  
X Rays ◽  
Angular Range ◽  
Acceptance Angle ◽  
Sem Images ◽  
Worst Case ◽  
X Ray ◽  
Focusing Distance ◽  
Layered Crystals ◽  
Working Distance

The minimum magnification for which an image can be acquired is determined by the design and implementation of the electron optical column and the scanning and display electronics. It is also a function of the working distance and, possibly, the accelerating voltage. For secondary and backscattered electron images there are usually no other limiting factors. However, for x-ray maps there are further considerations. The energy-dispersive x-ray spectrometers (EDS) have a much larger solid angle of detection that for WDS. They also do not suffer from Bragg’s Law focusing effects which limit the angular range and focusing distance from the diffracting crystal. In practical terms EDS maps can be acquired at the lowest magnification of the SEM, assuming the collimator does not cutoff the x-ray signal. For WDS the focusing properties of the crystal limits the angular range of acceptance of the incident x-radiation. The range is dependent upon the 2d spacing of the crystal, with the acceptance angle increasing with 2d spacing. The natural line width of the x-ray also plays a role. For the metal layered crystals used to diffract soft x-rays, such as Be - O, the minimum magnification is approximately 100X. In the worst case, for the LEF crystal which diffracts Ti - Zn, ˜1000X is the minimum.

Low-Energy-Electron-Diffraction Structural Studies of (100) Cleavage Surfaces of In4Se3 Layered Crystals

2014 ◽  
Vol 59 (6) ◽  
pp. 612-621 ◽  
Author(s):  
P.V. Galiy ◽  
◽  
Ya.B. Losovyj ◽  
T.M. Nenchuk ◽  
I.R. Yarovets’ ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Low Energy ◽  
Energy Electron ◽  
Structural Studies ◽  
Low Energy Electron Diffraction ◽  
Layered Crystals ◽  
Low Energy Electron

Influence of Defective Formations on Photoconductivity of Layered Crystals with Cationic Substitution

2018 ◽  
Vol 10 (6) ◽  
pp. 06025-1-06025-4 ◽  
Author(s):  
A. Kashuba ◽  
◽  
B. Andriyevskyy ◽  
I. Semkiv ◽  
L. Andriyevska ◽  
...  
Keyword(s):  
Cationic Substitution ◽  
Layered Crystals

Surface phonons in layered crystals: theoretical aspects

1994 ◽  
Vol 20 (1) ◽  
pp. 1-43 ◽  
Author(s):  
G. Benedek ◽  
F. Hofmann ◽  
P. Ruggerone ◽  
G. Onida ◽  
L. Miglio
Keyword(s):  
Layered Crystals ◽  
Surface Phonons

Manganese as a fast charge carrier trapping center in InP

2006 ◽  
Vol 382 (1-2) ◽  
pp. 220-228 ◽  
Author(s):  
K.P. Korona ◽  
A. Wysmolek ◽  
M. Kamińska ◽  
A. Twardowski ◽  
M. Piersa ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Trapping Center ◽  
Fast Charge ◽  
Carrier Trapping ◽  
Charge Carrier Trapping
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