Czochralski silicon characterization by using thermoelectric power measurements at high pressure
2003 ◽
Vol 340-342
◽
pp. 1026-1030
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A technique for thermoelectric power measurements at high pressure in an octahedral multianvil press
2000 ◽
Vol 71
(8)
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pp. 3138-3140
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2004 ◽
Vol 132
(5)
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pp. 333-336
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Keyword(s):
Keyword(s):
2015 ◽
Vol 45
(1)
◽
pp. 307-311
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2002 ◽
Vol 14
(43)
◽
pp. 10305-10316
◽
2009 ◽
Vol 44
(16)
◽
pp. 4499-4502
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Keyword(s):
1998 ◽
Vol 113-115
(1-2)
◽
pp. 393-402
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