Stochastic comparisons of series, parallel and k-out-of-n systems with heterogeneous bathtub failure rate type components

2020 ◽  
Vol 540 ◽  
pp. 123124 ◽  
Author(s):  
Dhrubasish Bhattacharyya ◽  
Ruhul Ali Khan ◽  
Murari Mitra
Keyword(s):  
Failure Rate ◽  
Stochastic Comparisons ◽  
Rate Type

scholarly journals RELIABILITY OF AIR SEPARATION MODULE COMPONENTS ON THE NITROGEN GENERATION SYSTEM OF BOEING AIRCRAFT

Vortex ◽  
2021 ◽  
Vol 2 (1) ◽  
pp. 78
Author(s):  
Wahyu Kurniawan
Keyword(s):  
Failure Rate ◽  
Air Separation ◽  
Aircraft Maintenance ◽  
Original Condition ◽  
Generation System ◽  
Aircraft Systems ◽  
Short Time ◽  
Type Of Failure ◽  
Rate Type

Aircraft is a type of transportation that can reach a certain area in a short time compared to other types of transportation. Every aircraft used will experience a decrease in performance along with the use of flight hours, to maintain and restore the aircraft condition to its original condition, maintenance effectiveness is needed. Aircraft maintenance carried out to keep the aircraft systems or components working properly, one of the components that need maintenance is the Air Separation Module. The purpose of this study to determine the reliability, failure rate, type of failure, and effectiveness of maintenance of the Air Separation Module.

إيجاد أفضل مقدر لمعلمات التوزيع الخطي العام لمعدلات الفشل باستخدام المحاكاة

2012 ◽  
Vol 18 (69) ◽  
pp. 237
Author(s):  
فاتن فاروق البدري ◽  
علا علي فرج
Keyword(s):  
Failure Rate ◽  
Rate Distribution

تهدف دراسة التوزيعات الإحصائية إلى الحصول على التوصيفات الأفضل لمجموعة المتغيرات والظواهر والتي كل منها يمكن أن يسلك سلوك واحد من هذه التوزيعات. وتعد دراسة عمليات التقدير لمعلمات هذه  التوزيعات من الأمور المهمة والتي لا غنى عنها في دراسة سلوك هذه المتغيرات ونتيجة لذلك جاء هذا البحث محاولة للوصول إلى أفضل طريقة تقدير معلمات توزيع هو واحد من أهم التوزيعات الإحصائية وهو التوزيع الخطي العام لمعدلات الفشل، (Generalized Linear Failure Rate Distribution) وذلك من خلال دراسة الجوانب النظرية بالاعتماد على طرق الاستدلال الإحصائي مثل طريقة الإمكان الأعظم وطريقة المربعات الصغرى وبالإضافة إلى الطريقة المختلطة(طريقة مقترحة) . وتضمن البحث إجراء المقارنات بين طرائق التقدير الثلاثة لمعلمات التوزيع الخطي العام لمعدلات الفشل (GLFRD)، بالاعتماد على مقياسين إحصائيين مهمين هما متوسط مربعات الخطأ (MSE)، ومتوسط الخطأ النسبي المطلق (MAPE)، للحصول على طريقة التقدير الأفضل.

Introduction to methods of describing the forecast on the risk of failure to the means of transport

2012 ◽  
Vol 30 (1) ◽  
pp. 119-127
Author(s):  
Henryk Tomaszek ◽  
Ryszard Kaleta ◽  
Mariusz Zieja
Keyword(s):  
Long Range ◽  
Failure Rate ◽  
Risk Of Failure ◽  
The Relationship ◽  
Preliminary Description

The paper is an attempt to describe the forecast on the risk of damages resulting from failures to the means of transport. It has been assumed that the product of the probability of failure (fault) occurrence and measures of effects thereof are to be used to estimate the risk. The below presented dependences that describe the risk of damages have been based on the failure rate. With the available literature as the basis, a preliminary description of the probability of a failure (fault) and the level of losses has been proposed. The paper gives dependences on short- and long-range risk forecasts. To determine the relationship for the probability of a failure (fault), the failure rate has been used.

Electromigration and Electrochemical Reaction Mixed Failure Mechanism in Gold Interconnection System

1999 ◽  
Author(s):  
Hide Murayama ◽  
Makoto Yamazaki ◽  
Shigeru Nakajima
Keyword(s):  
Failure Mechanism ◽  
Failure Rate ◽  
Electrochemical Reaction ◽  
Dielectric Films ◽  
Failure Rates ◽  
Interlayer Dielectric ◽  
Bipolar Devices ◽  
Gold Metallization

Abstract Power bipolar devices with gold metallization experience high failure rates. The failures are characterized as shorts, detected during LSI testing at burn-in. Many of these shorted locations are the same for the failed devices. From a statistical lot analysis, it is found that the short failure rate is higher for devices with thinner interlayer dielectric films. Based upon these results, a new electromigration and electrochemical reaction mixed failure mechanism is proposed for the failure.

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