Nonlinear instability of charged liquid jets: Effect of interfacial charge relaxation

2007 ◽  
Vol 375 (2) ◽  
pp. 411-428 ◽  
Author(s):  
Abd Elmonem Khalil Elcoot
1971 ◽  
Vol 48 (4) ◽  
pp. 815-827 ◽  
Author(s):  
D. A. Saville

The interactions between electrical tractions at the interface of a liquid jet and instability phenomena are studied with emphasis on effects due to interfacial charge relaxation. Charge relaxation causes the oscillatory growth of a perturbation. When viscous effects are small, small fields tend to decrease the growth rate of the axisymmetric mode, up to a point, and precipitate instability of the non-axisymmetric modes. Still larger field strengths increase the growth rates of asymmetric as well as axisymmetric modes. Instabilities characterized by highfrequency oscillations appear to persist even though the charge relaxation phenomena may be quite rapid. When, on the other hand, viscous effects predominate the only unstable disturbance form is the axisymmetric one, although the manner of growth may be oscillatory.


1996 ◽  
Vol 451 ◽  
Author(s):  
T. P. Moffat

ABSTRACTA variety of Cu/(Ni, Co) multilayers have been grown on Cu single crystals by pulse plating from an alloy electroplating bath. Copper is deposited under mass transport control while the iron group metal is deposited under interfacial charge transfer control. The structural evolution of these films is influenced by the morphological instability of the mass transport limited copper deposition reaction and the development of growth twins during iron-group metal deposition. Specular films have been obtained for growth on Cu(100) while rough, defective films were typically obtained for growth on Cu(111) and Cu(110).


2015 ◽  
Vol 25 (1) ◽  
pp. 47-80 ◽  
Author(s):  
Bejoy Mandumpala Devassy ◽  
Chawki Habchi ◽  
Eric Daniel
Keyword(s):  

1994 ◽  
Vol 4 (4) ◽  
pp. 451-471 ◽  
Author(s):  
Nobuyuki Yatsuyanagi ◽  
Hiroshi Sakamoto ◽  
Kazuo Sato

2008 ◽  
Vol 18 (7) ◽  
pp. 571-617 ◽  
Author(s):  
Vedanth Srinivasan ◽  
Abraham J. Salazar ◽  
Kozo Saito

2010 ◽  
Vol 20 (4) ◽  
pp. 311-336 ◽  
Author(s):  
H. Pitsch ◽  
Olivier Desjardins

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