C 1s K-edge near edge X-ray absorption fine structure (NEXAFS) spectroscopy for characterizing functional group chemistry of black carbon

2011 ◽  
Vol 42 (9) ◽  
pp. 1055-1064 ◽  
Author(s):  
Karen Heymann ◽  
Johannes Lehmann ◽  
Dawit Solomon ◽  
Michael W.I. Schmidt ◽  
Thomas Regier
Keyword(s):  
Fine Structure ◽  
Black Carbon ◽  
Functional Group ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
X Ray Absorption

Near Edge X-Ray Absorption Fine Structure (NEXAFS) Microscopy: Chemical Analysis at Sub Visible Spatial Resolution

1997 ◽  
Vol 3 (S2) ◽  
pp. 851-852
Author(s):  
H. Ade
Keyword(s):  
Fine Structure ◽  
Compositional Analysis ◽  
High Sensitivity ◽  
Linear Dichroism ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Wide Range ◽  
X Ray Absorption

Infrared, Raman, and fluorescence/luminescence microspectroscopy/microscopy in many instances seek to provide high sensitivity compositional and functional information that goes beyond mere elemental composition. This goal is shared by NEXAFS microscopy, in which Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy is employed to provide chemical sensitivity and can be relatively easily adopted in a scanning transmission x-ray microscope (STXM). In addition to compositional information, NEXAFS microscopy can exploit the dependence of x-ray absorption resonances on the bond orientation relative to the linearly polarized x rays (linear dichroism microscopy). For compositional analysis, NEXAFS microscopy is analogous to Electron Energy Loss Spectroscopy (EELS) in an electron microscope. However, when utilizing near edge spectral features, NEXAFS microscopy requires a considerable lower dose than EELS microscopy which makes it very suitable to studying radiation sensitive materials such as polymers. NEXAFS has shown to have excellent sensitivity to a wide range of moieties in polymers, including sensitivity to substitution isomerism.

Investigating the structure of boron nitride nanotubes by near-edge X-ray absorption fine structure (NEXAFS) spectroscopy

2005 ◽  
Vol 7 (6) ◽  
pp. 1103 ◽  
Author(s):  
Tirandai Hemraj-Benny ◽  
Sarbajit BanerjeeCurrent address: Department ◽  
Sharadha Sambasivan ◽  
Daniel A. Fischer ◽  
Weiqiang Han ◽  
...  
Keyword(s):  
Fine Structure ◽  
Boron Nitride ◽  
Boron Nitride Nanotubes ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
X Ray Absorption

Electronic Structure of Individual Hybrid Colloid Particles Studied by Near-Edge X-ray Absorption Fine Structure (NEXAFS) Spectroscopy in the X-ray Microscope

Nano Letters ◽  
2013 ◽  
Vol 13 (2) ◽  
pp. 824-828 ◽  
Author(s):  
Katja Henzler ◽  
Peter Guttmann ◽  
Yan Lu ◽  
Frank Polzer ◽  
Gerd Schneider ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Colloid Particles ◽  
X Ray Absorption

Cyclic dipeptide immobilization on Au(111) and Cu(110) surfaces

2014 ◽  
Vol 16 (14) ◽  
pp. 6657-6665 ◽  
Author(s):  
Oksana Plekan ◽  
Vitaliy Feyer ◽  
Sylwia Ptasińska ◽  
Nataliya Tsud ◽  
Kevin C. Prince
Keyword(s):  
Fine Structure ◽  
Photoelectron Spectroscopy ◽  
Adsorption Properties ◽  
Cyclic Dipeptide ◽  
Cyclic Dipeptides ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
X Ray Absorption

Soft X-ray Photoelectron Spectroscopy (XPS) and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy have been used to probe the electronic and adsorption properties of two cyclic dipeptides, i.e. cyclo(glycyl-histidyl) and cyclo(phenylalanyl-prolyl), on Au(111) and Cu(110) surfaces.

NEXAFS and XPS studies of nitrosyl chloride

2015 ◽  
Vol 17 (14) ◽  
pp. 9040-9048 ◽  
Author(s):  
Luca Schio ◽  
Cui Li ◽  
Susanna Monti ◽  
Peter Salén ◽  
Vasyl Yatsyna ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
Gas Phase ◽  
Theoretical Study ◽  
Nitrosyl Chloride ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
X Ray Absorption

The electronic structure of nitrosyl chloride (ClNO) has been investigated in the gas phase by X-ray Photoelectron (XPS) and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy at the Cl 2p, Cl 2s, N 1s and O 1s edges in a combined experimental and theoretical study.

scholarly journals Study of Hard Disk and Slider Surfaces Using X-Ray Photoemission Electron Microscopy and Near Edge X-Ray Absorption Fine Structure Spectroscopy

1998 ◽  
Vol 517 ◽  
Author(s):  
Simone Anders ◽  
Thomas Stammler ◽  
C. Singh Bhatia ◽  
Joachim Stöhr ◽  
Walton Fong ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Fine Structure ◽  
Thermal Desorption ◽  
Wear Test ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Before And After ◽  
Carbon Overcoats ◽  
X Ray Absorption

AbstractX-ray Photo Emission Electron Microscopy (X-PEEM) and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy were applied to study the properties of amorphous hard carbon overcoats on disks and sliders, and the properties of the lubricant. The modification of lubricants after performing thermal desorption studies was measured by NEXAFS, and the results are compared to thermal desorption data. The study of lubricant degradation in wear tracks is described. Sliders were investigated before and after wear test, and the modification of the slider coating as well as the transfer of lubricant to the slider was studied. The studies show that the lubricant is altered chemically during the wear. Fluorine is removed and carboxyl groups are formed.

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