Influence of limited random-phase of objects on the image quality of 3D holographic display

2017 ◽  
Vol 385 ◽  
pp. 153-159 ◽  
Author(s):  
He Ma ◽  
Juan Liu ◽  
Minqiang Yang ◽  
Xin Li ◽  
Gaolei Xue ◽  
...  
2019 ◽  
Vol 442 ◽  
pp. 84-89 ◽  
Author(s):  
Tao Zhao ◽  
Juan Liu ◽  
Junyi Duan ◽  
Xin Li ◽  
Yongtian Wang

Author(s):  
Yumi Yamaguchi ◽  
Yuki Nagahama ◽  
Yota Yamamoto ◽  
Tomoyoshi Shimobaba ◽  
Takashi Kakue ◽  
...  
Keyword(s):  

Author(s):  
Yumi Yamaguchi ◽  
Yuki Nagahama ◽  
Yota Yamamoto ◽  
Tomoyoshi Shimobaba ◽  
Takashi Kakue ◽  
...  
Keyword(s):  

2015 ◽  
Vol 355 ◽  
pp. 596-601 ◽  
Author(s):  
Tomoyoshi Shimobaba ◽  
Takashi Kakue ◽  
Yutaka Endo ◽  
Ryuji Hirayama ◽  
Daisuke Hiyama ◽  
...  

Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.


2001 ◽  
Vol 30 (6) ◽  
pp. 308-313 ◽  
Author(s):  
F Gijbels ◽  
G Sanderink ◽  
C Bou Serhal ◽  
H Pauwels ◽  
R Jacobs

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