Experimental demonstration of scanning phase retrieval by a noniterative method with a Gaussian-amplitude beam

2017 ◽  
Vol 382 ◽  
pp. 428-436
Author(s):  
Nobuharu Nakajima ◽  
Masayuki Yoshino
Keyword(s):  
Phase Retrieval ◽  
Experimental Demonstration

scholarly journals Astigmatic phase retrieval: an experimental demonstration

2009 ◽  
Vol 17 (14) ◽  
pp. 11905 ◽  
Author(s):  
Clare A. Henderson ◽  
Garth J. Williams ◽  
Andrew G. Peele ◽  
Harry M. Quiney ◽  
Keith A. Nugent
Keyword(s):  
Phase Retrieval ◽  
Experimental Demonstration

Quantitative analysis by reconstruction of HREM focal series

1994 ◽  
Vol 52 ◽  
pp. 740-741
Author(s):  
W. Coene ◽  
A. Thust ◽  
M. Op de Beeck ◽  
D. Van Dyck
Keyword(s):  
Phase Retrieval ◽  
Image Plane ◽  
Initial Guess ◽  
Recursive Least Squares ◽  
Objective Lens ◽  
Electron Wave ◽  
Electron Sources ◽  
Original Algorithm ◽  
Coherent Field ◽  
Direct Interpretation

Compared to conventional electron sources, the use of a highly coherent field-emission gun (FEG) in TEM improves the information resolution considerably. A direct interpretation of this extra information, however, is hampered since amplitude and phase of the electron wave are scrambled in a complicated way upon transfer from the specimen exit plane through the objective lens towards the image plane. In order to make the additional high-resolution information interpretable, a phase retrieval procedure is applied, which yields the aberration-corrected electron wave from a focal series of HRTEM images (Coene et al, 1992).Kirkland (1984) tackled non-linear image reconstruction using a recursive least-squares formalism in which the electron wave is modified stepwise towards the solution which optimally matches the contrast features in the experimental through-focus series. The original algorithm suffers from two major drawbacks : first, the result depends strongly on the quality of the initial guess of the first step, second, the processing time is impractically high.

Limitations to the Spacing Effect

2005 ◽  
Vol 52 (4) ◽  
pp. 257-263 ◽  
Author(s):  
Peter P. J. L. Verkoeijen ◽  
Remy M. J. P. Rikers ◽  
Henk G. Schmidt
Keyword(s):  
Free Recall ◽  
Phase Retrieval ◽  
Incidental Learning ◽  
Factor Model ◽  
Recall Performance ◽  
Spacing Effect ◽  
Word List ◽  
Intentional Learning ◽  
Study Phase ◽  
Learning Condition

Abstract. The spacing effect refers to the finding that memory for repeated items improves when the interrepetition interval increases. To explain the spacing effect in free-recall tasks, a two-factor model has been put forward that combines mechanisms of contextual variability and study-phase retrieval (e.g., Raaijmakers, 2003 ; Verkoeijen, Rikers, & Schmidt, 2004 ). An important, yet untested, implication of this model is that free recall of repetitions should follow an inverted u-shaped relationship with interrepetition spacing. To demonstrate the suggested relationship an experiment was conducted. Participants studied a word list, consisting of items repeated at different interrepetition intervals, either under incidental or under intentional learning instructions. Subsequently, participants received a free-recall test. The results revealed an inverted u-shaped relationship between free recall and interrepetition spacing in both the incidental-learning condition and the intentional-learning condition. Moreover, for intentionally learned repetitions, the maximum free-recall performance was located at a longer interrepetition interval than for incidentally learned repetitions. These findings are interpreted in terms of the two-factor model of spacing effects in free-recall tasks.

Study-Phase Retrieval: Suppressing False Recognition in a Repetition Paradigm

2007 ◽  
Author(s):  
Peter M. Wessels ◽  
Jonathan Schnader ◽  
Allison Smith ◽  
Christopher Thomas ◽  
Haley Titus
Keyword(s):  
False Recognition ◽  
Phase Retrieval ◽  
Study Phase

X-ray microscopy by phase-retrieval methods at the advanced light source

2003 ◽  
Vol 104 ◽  
pp. 557-561 ◽  
Author(s):  
M. R. Howells ◽  
H. Chapman ◽  
S. Hau-Riege ◽  
H. He ◽  
S. Marchesini ◽  
...  
Keyword(s):  
Light Source ◽  
Phase Retrieval ◽  
X Ray ◽  
Advanced Light Source
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