Self-consistent model for ultrafast near-field microscopy and near-field luminescence microscopy modeling of semiconductor surface
Keyword(s):
2000 ◽
Vol 61
(16)
◽
pp. 11139-11150
◽
1993 ◽
Vol 10
(5)
◽
pp. 878
◽
1998 ◽
Vol 52
(11)
◽
pp. 89-96
Keyword(s):
2020 ◽
Vol 158
(2(8))
◽
pp. 295-299
1989 ◽
Vol 104
(2)
◽
pp. 49-52
1995 ◽
Vol 10
(5)
◽
pp. 577-585
◽