Novel method for design of surface relief guided-mode resonant gratings at normal incidence

2008 ◽  
Vol 281 (12) ◽  
pp. 3295-3300 ◽  
Author(s):  
Jianyong Ma ◽  
Shijie Liu ◽  
Yunxia Jin ◽  
Cheng Xu ◽  
Jianda Shao ◽  
...  
Keyword(s):  
Surface Relief ◽  
Normal Incidence ◽  
Guided Mode ◽  
Novel Method

Single-material guided-mode resonance filter for TE waves under normal incidence

2010 ◽  
Vol 8 (5) ◽  
pp. 447-448 ◽  
Author(s):  
孙天玉 Tianyu Sun ◽  
麻健勇 Jianyong Ma ◽  
付小勇 Xiaoyong Fu ◽  
汪剑鹏 Jianpeng Wang ◽  
晋云霞 Yunxia Jin ◽  
...  
Keyword(s):  
Normal Incidence ◽  
Guided Mode ◽  
Guided Mode Resonance ◽  
Single Material

Effects of modulation strength in guided-mode resonant subwavelength gratings at normal incidence

2000 ◽  
Vol 17 (7) ◽  
pp. 1221 ◽  
Author(s):  
David L. Brundrett ◽  
Elias N. Glytsis ◽  
Thomas K. Gaylord ◽  
Jon M. Bendickson
Keyword(s):  
Normal Incidence ◽  
Guided Mode ◽  
Subwavelength Gratings

scholarly journals Replicable one-dimensional non-polarizing guided mode resonance gratings under normal incidence

2012 ◽  
Vol 20 (15) ◽  
pp. 16974 ◽  
Author(s):  
Muhammad Rizwan Saleem ◽  
Dandan Zheng ◽  
Benfeng Bai ◽  
Petri Stenberg ◽  
Markku Kuittinen ◽  
...  
Keyword(s):  
Normal Incidence ◽  
One Dimensional ◽  
Guided Mode ◽  
Guided Mode Resonance

A model for fast predicting and optimizing the sensitivity of surface-relief guided mode resonance sensors

2013 ◽  
Vol 176 ◽  
pp. 1197-1203 ◽  
Author(s):  
Sheng Fu Lin ◽  
Chih Ming Wang ◽  
Ya Lun Tsai ◽  
Ting Jou Ding ◽  
Tsung Hsun Yang ◽  
...  
Keyword(s):  
Surface Relief ◽  
Guided Mode ◽  
Guided Mode Resonance

Single-layer one-dimensional nonpolarizing guided-mode resonance filters under normal incidence

2011 ◽  
Vol 36 (13) ◽  
pp. 2411 ◽  
Author(s):  
Tapani Alasaarela ◽  
Dandan Zheng ◽  
Lingling Huang ◽  
Arri Priimagi ◽  
Benfeng Bai ◽  
...  
Keyword(s):  
Single Layer ◽  
Normal Incidence ◽  
One Dimensional ◽  
Guided Mode ◽  
Guided Mode Resonance

Tunable narrowband metamaterial perfect absorber with single absorption peak

2020 ◽  
Vol 34 (28) ◽  
pp. 2050303
Author(s):  
Zhe Yin ◽  
Jianhui Song ◽  
Yang Yu ◽  
Hongwei Gao ◽  
Jun Liu ◽  
...  
Keyword(s):  
Fdtd Method ◽  
Normal Incidence ◽  
Absorption Peak ◽  
Perfect Absorber ◽  
Guided Mode ◽  
Strong Surface ◽  
Guided Mode Resonance ◽  
Ag Substrate ◽  
Spectral Responses ◽  
Metamaterial Perfect Absorber

A tunable narrowband metamaterial perfect absorber (NMPA) with single absorption peak at both normal incidence and oblique incidence is proposed. The spectral responses of the designed NMPA are calculated using finite-difference time-domain (FDTD) method. By using an Ag guided-mode resonance grating layer with great fill factor, the designed NMPA exhibits single resonance peak, which is converted to heat due to the strong surface plasmon resonance around the Ag grating and the Ag substrate. An NMPA sample is fabricated and the spectral responses are measured to verify the theoretical results. The experimental results are consistent with the theoretical ones.

Normal-incidence guided-mode resonant grating filters:?design and experimental demonstration

1998 ◽  
Vol 23 (9) ◽  
pp. 700 ◽  
Author(s):  
David L. Brundrett ◽  
Elias N. Glytsis ◽  
Thomas K. Gaylord
Keyword(s):  
Normal Incidence ◽  
Experimental Demonstration ◽  
Guided Mode ◽  
Resonant Grating

Analysis of Contrast Reversal in SEM Images

1972 ◽  
Vol 30 ◽  
pp. 398-399
Author(s):  
M. D. Coutts ◽  
E. R. Levin
Keyword(s):  
Incident Beam ◽  
Normal Incidence ◽  
Beam Current ◽  
Secondary Emission ◽  
Image Contrast ◽  
Sem Images ◽  
Secondary Electrons ◽  
Image Position

On tilting samples in an SEM, the image contrast between two elements, x and y often decreases to zero at θε, which we call the no-contrast angle. At angles above θε the contrast is reversed, θ being the angle between the specimen normal and the incident beam. The available contrast between two elements, x and y, in the SEM can be defined as,(1)where ix and iy are the total number of reflected and secondary electrons, leaving x and y respectively. It can easily be shown that for the element x,(2)where ib is the beam current, isp the specimen absorbed current, δo the secondary emission at normal incidence, k is a constant, and m the reflected electron coefficient.

X-ray Gabor holography

1995 ◽  
Vol 53 ◽  
pp. 612-613
Author(s):  
Steve Lindaas ◽  
Chris Jacobsen ◽  
Alex Kalinovsky ◽  
Malcolm Howells
Keyword(s):  
Surface Relief ◽  
Biological Imaging ◽  
Specimen Preparation ◽  
X Rays ◽  
X Ray ◽  
Water Window ◽  
Biological Objects ◽  
Transmission Imaging ◽  
Atomic Force ◽  
Electron Microscopes

Soft x-ray microscopy offers an approach to transmission imaging of wet, micron-thick biological objects at a resolution superior to that of optical microscopes and with less specimen preparation/manipulation than electron microscopes. Gabor holography has unique characteristics which make it particularly well suited for certain investigations: it requires no prefocussing, it is compatible with flash x-ray sources, and it is able to use the whole footprint of multimode sources. Our method serves to refine this technique in anticipation of the development of suitable flash sources (such as x-ray lasers) and to develop cryo capabilities with which to reduce specimen damage. Our primary emphasis has been on biological imaging so we use x-rays in the water window (between the Oxygen-K and Carbon-K absorption edges) with which we record holograms in vacuum or in air.The hologram is recorded on a high resolution recording medium; our work employs the photoresist poly(methylmethacrylate) (PMMA). Following resist “development” (solvent etching), a surface relief pattern is produced which an atomic force microscope is aptly suited to image.

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