Reconstruction of extraordinary refractive index profiles of optical planar waveguides with single or double modes fabricated by O2+ ion implantation into lithium niobate

2008 ◽  
Vol 281 (6) ◽  
pp. 1529-1533 ◽  
Author(s):  
Xiangzhi Liu ◽  
Fei Lu ◽  
Feng Chen ◽  
Yang Tan ◽  
Ruifeng Zhang ◽  
...  
2001 ◽  
Vol 40 (22) ◽  
pp. 3759 ◽  
Author(s):  
Hui Hu ◽  
Fei Lu ◽  
Feng Chen ◽  
Bo-Rong Shi ◽  
Ke-Ming Wang ◽  
...  

2020 ◽  
Vol 49 (4) ◽  
pp. 423001-423001
Author(s):  
吕婧妍 Jing-yan Lü ◽  
郭海涛 Hai-tao GUO ◽  
徐君 Jun XU ◽  
刘春晓 Chun-xiao LIU

1991 ◽  
Vol 244 ◽  
Author(s):  
P. Moretti ◽  
P. Thevenard ◽  
K. Wirl ◽  
P. Hertel

ABSTRACTOptical planar waveguides, with a controllable thickness in a very wide range, typically from 3 to 20 μm, can be fabricated by thermally controlled proton implantation in LiNbO3. In the nuclear stopping region at the end of the ion's tracks a sufficient decrease in refractive index is obtained, thus forming an adequate optical barrier. The mode confinement was investigated by dark line mode spectroscopy, and the refractive index profiles were reconstructed. The effects of different ion fluences and ion energies in the Mev range on the refractive index profile at 300 K have been investigated.


2018 ◽  
Vol 57 (01) ◽  
pp. 1 ◽  
Author(s):  
Yue Wang ◽  
Xiao-Liang Shen ◽  
Rui-Lin Zheng ◽  
Hai-Tao Guo ◽  
Peng Lv ◽  
...  

1989 ◽  
Vol 152 ◽  
Author(s):  
T. Bremer

ABSTRACTThe influence of ion beam induced lattice damage on the refractive indices is evaluated for He+ implanted planar waveguides in lithium niobate (LiNbO3) and potassium niobate (KNbO3 ). KNbO3 exhibits a higher sensitivity for ion beam induced refractive index alterations. In order to suppress leaky modes, varying angle implantation has been applied. The annealing of electronic damage in both crystals is compared. While it requires heating up to 200°C for LiNbO3, the electronic damage in KNbO3 has been found to anneal at much lower temperatures. Annealing takes place even at room temparature, the electronic damage vanishes almost completely within 100 days.


1974 ◽  
Vol 25 (6) ◽  
pp. 329-331 ◽  
Author(s):  
David T. Y. Wei ◽  
William W. Lee ◽  
Louis R. Bloom

1997 ◽  
Vol 36 (Part 1, No. 7A) ◽  
pp. 4323-4325 ◽  
Author(s):  
Fei Lu ◽  
Ming-Qi Meng ◽  
Ke-Ming Wang ◽  
Xiang-Dong Liu ◽  
Huan-Chu Chen

2018 ◽  
Vol 72 (7) ◽  
pp. 765-769 ◽  
Author(s):  
Yue Wang ◽  
Xiao-Liang Shen ◽  
Rui-Lin Zheng ◽  
Peng Lv ◽  
Chun-Xiao Liu ◽  
...  

2006 ◽  
Vol 23 (6) ◽  
pp. 1501-1503
Author(s):  
Chen Feng ◽  
Wang Xue-Lin ◽  
Wang Ke-Ming ◽  
Wang Lei ◽  
Jiao Yang ◽  
...  

Author(s):  
S. Sugliani ◽  
M. Bianconi ◽  
G.G. Bentini ◽  
M. Chiarini ◽  
P. De Nicola ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document