Non-destructive micro-X-ray diffraction analysis of painted artefacts: Determination of detection limits for the chromium oxide–zinc oxide matrix

2006 ◽  
Vol 251 (2) ◽  
pp. 489-495 ◽  
Author(s):  
P. Nel ◽  
D. Lau ◽  
D. Hay ◽  
N. Wright
Keyword(s):  
Zinc Oxide ◽  
Diffraction Analysis ◽  
Chromium Oxide ◽  
Detection Limits ◽  
X Ray Diffraction ◽  
X Ray ◽  
Oxide Matrix ◽  
Non Destructive

Synthesis of 4-(3-coumarinyl)-3-benzyl-4-thiazolin-2-one 4-methylbenzylidenehydrazone and determination of the isomeric structure by X-ray analysis

2003 ◽  
Vol 218 (12) ◽  
Author(s):  
Süheyla Özbey ◽  
Nilgün Karalı ◽  
Aysel Gürsoy
Keyword(s):  
Single Crystal ◽  
Diffraction Analysis ◽  
Spectral Data ◽  
X Ray Diffraction ◽  
X Ray ◽  
Isomeric Structure ◽  
Elemental Analyses

AbstractIn this study 4-(3-coumarinyl)-3-benzyl-4-thi azolin-2-one 4-methylbenzylidenehydrazone 3 was synthesised. An independent proof of the thiazolylhydrazone structure of 3 was achieved by single crystal X-ray diffraction analysis. Elemental analyses and spectral data (IR,

Standardisation of X-Ray Powder Diffraction Methods

2004 ◽  
Vol 443-444 ◽  
pp. 31-34
Author(s):  
Giovanni Berti ◽  
Rob Delhez ◽  
S. Norval ◽  
B. Peplinski ◽  
E. Tolle ◽  
...  
Keyword(s):  
Technical Committee ◽  
Non Destructive Testing ◽  
X Ray Diffraction ◽  
Destructive Testing ◽  
X Ray ◽  
Standard Documents ◽  
And Control ◽  
Non Destructive ◽  
Research Centres

This paper outlines the standardisation process for the XRPD method that is currently being considered by a Working Group (WG10) of Technical Committee 138 "Non-destructive Testing" of the European Committee for Standardisation CEN. Several Standard Documents are on the verge of being released. These documents concern the general principles of (X-ray) diffraction, its terminology, and the basic procedures applied. Another document concerns the instruments used and it offers procedures to characterise and control the performance of an X-ray diffractometer properly. It is intended to issue Standard Documents on specific methods, e.g. determination of residual stresses. In fact work is in progress on this subject. The Standard Documents can be used by industry, government organisations, and research centres with activities related to safety, health and the environment, as well as for educational purposes.

X-Ray Diffraction Determination of Metallurgical Damage in Turbo Blower Rotor Shafts

1988 ◽  
Vol 142 ◽  
Author(s):  
John F. Porter ◽  
Dan O. Morehouse ◽  
Mike Brauss ◽  
Robert R. Hosbons ◽  
John H. Root ◽  
...  
Keyword(s):  
Residual Stress ◽  
Hole Drilling ◽  
X Ray Diffraction ◽  
X Ray ◽  
Turbo Blower ◽  
Diffraction Determination ◽  
Defence Research ◽  
Stress Profiles ◽  
Non Destructive

AbstractStudies have been ongoing at Defence Research Establishment Atlantic on the evaluation of non-destructive techniques for residual stress determination in structures. These techniques have included neutron diffraction, x-ray diffraction and blind-hole drilling. In conjunction with these studies, the applicability of these procedures to aid in metallurgical and failure analysis investigations has been explored. The x-ray diffraction technique was applied to investigate the failure mechanism in several bent turbo blower rotor shafts. All examinations had to be non-destructive in nature as the shafts were considered repairable. It was determined that residual stress profiles existed in the distorted shafts which strongly indicated the presence of martensitic microstuctures. These microstructures are considered unacceptable for these shafts due to the potential for cracking or in-service residual stress relaxation which could lead to future shaft distortion.

X-Ray Diffraction Analysis of Steel with Oxidised Surface Layer

2016 ◽  
Vol 368 ◽  
pp. 99-102
Author(s):  
Lukáš Zuzánek ◽  
Ondřej Řidký ◽  
Nikolaj Ganev ◽  
Kamil Kolařík
Keyword(s):  
Residual Stress ◽  
Surface Layer ◽  
Residual Stresses ◽  
Diffraction Analysis ◽  
Oxide Surface ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electrolytic Polishing ◽  
Small Depth

The basic principle of the X-ray diffraction analysis is based on the determination of components of residual stresses. They are determined on the basis of the change in the distance between atomic planes. The method is limited by a relatively small depth in which the X-ray beam penetrates into the analysed materials. For determination of residual stresses in the surface layer the X-ray diffraction and electrolytic polishing has to be combined. The article is deals with the determination of residual stress and real material structure of a laser-welded steel sample with an oxide surface layer. This surface layer is created during the rolling and it prevents the material from its corrosion. Before the X-ray diffraction analysis can be performed, this surface layer has to be removed. This surface layer cannot be removed with the help of electrolytic polishing and, therefore, it has to be removed mechanically. This mechanical procedure creates “technological” residual stress in the surface layer. This additional residual stress is removed by the electrolytic polishing in the depth between 20 and 80 μm. Finally, the real structure and residual stresses can be determined by using the X-ray diffraction techniques.

Structure determination of silica tantalum soda glasses by X-ray diffraction analysis

1995 ◽  
Vol 24 (1-3) ◽  
pp. 69-73 ◽  
Author(s):  
Manwar Hussain ◽  
Koichi Niihara ◽  
Koehi Fukumi
Keyword(s):  
Diffraction Analysis ◽  
Structure Determination ◽  
X Ray Diffraction ◽  
X Ray

Study of a chemical-vapor-deposited diamond thin film on a molybdenum substrate by glancing incidence X-ray diffraction

2007 ◽  
Vol 22 (4) ◽  
pp. 319-323 ◽  
Author(s):  
Jianfeng Fang ◽  
Jing Huo ◽  
Jinyuan Zhang ◽  
Yi Zheng
Keyword(s):  
Thin Film ◽  
Diffraction Analysis ◽  
Transition Layer ◽  
Chemical Vapor ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diamond Thin Film ◽  
Chemical Vapor Deposited

The structure of a chemical-vapor-deposited (CVD) diamond thin film on a Mo substrate was studied using quasi-parallel X-ray and glancing incidence techniques. Conventional X-ray diffraction analysis revealed that the sample consists of a diamond thin film, a Mo2C transition layer, and Mo substrate. The Mo2C transition layer was formed by a chemical reaction between the diamond film and the Mo substrate during the CVD process. A method for layer-thickness determination of the thin film and the transition layer was developed. This method was based on a relationship between X-ray diffraction intensities from the transition layer or its substrate and a function of grazing incidence angles. Results of glancing incidence X-ray diffraction analysis showed that thicknesses of the diamond thin film and the Mo2C transition layer were determined successfully with high precision.

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