Beam dynamic design of a high intensity injector for proton linac

2016 ◽  
Vol 827 ◽  
pp. 145-151 ◽  
Author(s):  
Wei-Ping Dou ◽  
Zhi-Jun Wang ◽  
Fang-Jian Jia ◽  
Yuan He ◽  
Zhi Wang ◽  
...  
Keyword(s):  
High Intensity ◽  
Dynamic Design ◽  
Beam Dynamic ◽  
Proton Linac

Development of an H− ion source for the high intensity proton linac

2002 ◽  
Vol 73 (2) ◽  
pp. 1021-1023 ◽  
Author(s):  
H. Oguri ◽  
Y. Okumura ◽  
K. Hasegawa ◽  
Y. Namekawa ◽  
T. Shimooka
Keyword(s):  
High Intensity ◽  
Ion Source ◽  
Proton Linac

Development of a H− ion source for the high intensity proton linac at Japan Atomic Energy Research Institute

2000 ◽  
Vol 71 (2) ◽  
pp. 975-977 ◽  
Author(s):  
H. Oguri ◽  
T. Tomisawa ◽  
M. Kinsho ◽  
Y. Okumura ◽  
M. Mizumoto
Keyword(s):  
High Intensity ◽  
Ion Source ◽  
Atomic Energy ◽  
Energy Research ◽  
Proton Linac ◽  
Research Institute

Development of bunch shape monitor for high-intensity beam on the China ADS proton LINAC Injector II

2018 ◽  
Vol 89 (5) ◽  
pp. 053303 ◽  
Author(s):  
Guangyu Zhu ◽  
Junxia Wu ◽  
Ze Du ◽  
Yong Zhang ◽  
Zongheng Xue ◽  
...  
Keyword(s):  
High Intensity ◽  
Proton Linac

A New High Intensity Grid Cap for RCA-EMU-3 Electron Microscopes

1968 ◽  
Vol 26 ◽  
pp. 316-317
Author(s):  
George Christov ◽  
Bolivar J. Lloyd
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
High Voltage ◽  
High Intensity ◽  
Electron Gun ◽  
Tungsten Filament ◽  
Fluorescent Screen ◽  
Electron Microscopes ◽  
Pass Through ◽  
Ground Potential

A new high intensity grid cap has been designed for the RCA-EMU-3 electron microscope. Various parameters of the new grid cap were investigated to determine its characteristics. The increase in illumination produced provides ease of focusing on the fluorescent screen at magnifications from 1500 to 50,000 times using an accelerating voltage of 50 KV.The EMU-3 type electron gun assembly consists of a V-shaped tungsten filament for a cathode with a thin metal threaded cathode shield and an anode with a central aperture to permit the beam to course the length of the column. The cathode shield is negatively biased at a potential of several hundred volts with respect to the filament. The electron beam is formed by electrons emitted from the tip of the filament which pass through an aperture of 0.1 inch diameter in the cap and then it is accelerated by the negative high voltage through a 0.625 inch diameter aperture in the anode which is at ground potential.

Thickness Measurement in the AEM by Macintosh-Based Analysis of Two-Beam Convergent Beam Patterns

1990 ◽  
Vol 48 (2) ◽  
pp. 504-505
Author(s):  
John F. Mansfield ◽  
Douglas C. Crawford
Keyword(s):  
Electron Microscope ◽  
Video Camera ◽  
Thickness Measurement ◽  
Specimen Thickness ◽  
Crystalline Materials ◽  
Beam Dynamic ◽  
Line Measurement ◽  
On Line ◽  
Image Position ◽  
Convergent Beam

A method has been developed that allows on-line measurement of the thickness of crystalline materials in the analytical electron microscope. Two-beam convergent beam electron diffraction (CBED) patterns are digitized from a JEOL 2000FX electron microscope into an Apple Macintosh II microcomputer via a Gatan #673 CCD Video Camera and an Imaging Systems Technology Video 1000 frame-capture board. It is necessary to know the lattice parameters of the sample since measurements are made of the spacing of the diffraction discs in order to calibrate the pattern. The sample thickness is calculated from measurements of the spacings of the fringes that are seen in the diffraction discs. This technique was pioneered by Kelly et al, who used the two-beam dynamic theory of MacGillavry relate the deviation parameter (Si) of the ith fringe from the exact Bragg condition to the specimen thickness (t) with the equation:Where ξg, is the extinction distance for that reflection and ni is an integer.

Calculation of many-beam dynamic electron diffraction without high-energy approximation

1996 ◽  
Vol 54 ◽  
pp. 128-129
Author(s):  
B. R. Ahn ◽  
N. J. Kim
Keyword(s):  
Electron Diffraction ◽  
Flat Surface ◽  
Dynamic Theory ◽  
High Energy ◽  
Perfect Crystal ◽  
Zone Axis ◽  
Beam Dynamic ◽  
Diffraction Angle ◽  
Energy Approximation ◽  
The Many

High energy approximation in dynamic theory of electron diffraction involves some intrinsic problems. First, the loss of theoretical strictness makes it difficult to comprehend the phenomena of electron diffraction. Secondly, it is difficult to believe that the approximation is reasonable especially in the following cases: 1) when accelerating voltage is not sufficiently high, 2) when the specimen is thick, 3) when the angle between the surface normal of the specimen and zone axis is large, and 4) when diffracted beam with large diffraction angle is included in the calculation. However, until now the method to calculate the many beam dynamic electron diffraction without the high energy approximation has not been proposed. For this reason, the authors propose a method to eliminate the high energy approximation in the calculation of many beam dynamic electron diffraction. In this method, a perfect crystal with flat surface was assumed. The method was applied to the calculation of [111] zone axis CBED patterns of Si.

260: High Intensity Focused Ultrasound Combined with Endocrine Therapy in Treating High or Intermediate Risk Prostate Cancer

2006 ◽  
Vol 175 (4S) ◽  
pp. 86-86
Author(s):  
Makoto Sumitomo ◽  
Junichi Asakuma ◽  
Yasumasa Hanawa ◽  
Kazuhiko Nagakura ◽  
Masamichi Hayakawa
Keyword(s):  
Prostate Cancer ◽  
Endocrine Therapy ◽  
High Intensity ◽  
Focused Ultrasound ◽  
High Intensity Focused Ultrasound ◽  
Intermediate Risk ◽  
Risk Prostate Cancer

1400: Early Clinical Experience Using High-Intensity Focused Ultrasound for the Treatment of Renal Tumours

2005 ◽  
Vol 173 (4S) ◽  
pp. 379-380
Author(s):  
James E. Kennedy ◽  
Rowland O. Illing ◽  
Feng Wu ◽  
Gail R. ter Haar ◽  
Rachel R. Phillips ◽  
...  
Keyword(s):  
Clinical Experience ◽  
High Intensity ◽  
Focused Ultrasound ◽  
High Intensity Focused Ultrasound ◽  
Early Clinical Experience ◽  
Renal Tumours
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