Performance of a fast acquisition system for in-beam PET monitoring tested with clinical proton beams

Author(s):  
M.A. Piliero ◽  
M.G. Bisogni ◽  
P. Cerello ◽  
A. Del Guerra ◽  
E. Fiorina ◽  
...  
2013 ◽  
Vol 303-306 ◽  
pp. 1629-1634
Author(s):  
Xu Zhang ◽  
Xi Chen ◽  
Li Xin Wei ◽  
Hong Tu Ma ◽  
Hua Han

When large-scale images acquisition conducted on an Integrated Circuit (IC) chip by using an optical microscope, multi-layer routing structure and transparent inter-layer dielectric of IC chips can interfere with auto-focusing of an optical microscope, which significantly increases the images’ acquisition time. To solve the forementioned problems, a fast acquisition system is proposed based on surface fitting. First of all, we obtain focus plane height of multiple scattered points through pre-acquisition. Then, the surface fitting method, with Thin Plate Spline (TPS) model is applied, to get the height of the rest points. Thus the system can acquire correct surface-layer images of an IC chip without background interference. The experimental results suggest that the proposed technology is highly superior to manual acquisition system and auto-focusing based acquisition system in acquisition accuracy and speed, and it also decreases the amount of manual workload by 70%-80%.


2021 ◽  
Author(s):  
Yahe Yang ◽  
Song Song ◽  
Junxian Wu ◽  
Xiong Liu ◽  
Shuai Zhang ◽  
...  

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