Optimized readout methods of silicon drift detectors for high-resolution X-ray spectroscopy

Author(s):  
A. Niculae ◽  
P. Lechner ◽  
H. Soltau ◽  
G. Lutz ◽  
L. Strüder ◽  
...  
2004 ◽  
Vol 19 (2) ◽  
pp. 197-197
Author(s):  
H. Soltau ◽  
P. Lechner ◽  
G. Lutz ◽  
L. Strüder ◽  
C. Fiorini ◽  
...  

2011 ◽  
Vol 17 (S2) ◽  
pp. 892-893 ◽  
Author(s):  
R Terborg ◽  
J Berlin ◽  
T Salge

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


Author(s):  
Peter Lechner ◽  
Stefan Eckbauer ◽  
Robert Hartmann ◽  
Susanne Krisch ◽  
Dieter Hauff ◽  
...  

2003 ◽  
Vol 18 (2) ◽  
pp. 175-175 ◽  
Author(s):  
P. Lechner ◽  
H. Soltau ◽  
C. Fiorini ◽  
A. Longoni ◽  
G. Lutz ◽  
...  

2005 ◽  
Vol 34 (5) ◽  
pp. 439-445 ◽  
Author(s):  
A. Longoni ◽  
C. Fiorini ◽  
C. Guazzoni ◽  
S. Buzzetti ◽  
M. Bellini ◽  
...  

2005 ◽  
Vol 20 (2) ◽  
pp. 185-185
Author(s):  
A. Niculae ◽  
H. Soltau ◽  
P. Lechner ◽  
G. Lutz ◽  
L. Strüder ◽  
...  

2015 ◽  
Vol 62 (1) ◽  
pp. 221-227 ◽  
Author(s):  
R. Quaglia ◽  
L. Bombelli ◽  
P. Busca ◽  
C. Fiorini ◽  
M. Occhipinti ◽  
...  

2006 ◽  
Vol 21 (2) ◽  
pp. 182-182
Author(s):  
A. Niculae ◽  
H. Soltau ◽  
P. Lechner ◽  
A. Liebl ◽  
R. Eckhard ◽  
...  

2006 ◽  
Vol 12 (S02) ◽  
pp. 862-863
Author(s):  
A Niculae ◽  
H Soltau ◽  
P Lechner ◽  
A Liebl ◽  
G Lutz ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006


Sign in / Sign up

Export Citation Format

Share Document