Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films
2006 ◽
Vol 9
(1-3)
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pp. 315-322
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1996 ◽
Vol 11
(11)
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pp. 2825-2833
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1982 ◽
Vol 40
◽
pp. 722-723
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2012 ◽
Vol 23
(8)
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pp. 1047-1063
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2012 ◽
Vol 174-177
◽
pp. 508-511
2007 ◽
Vol 90
(11)
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pp. 3651-3655
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