3D characterization of individual multiphase particles in packed particle beds by X-ray microtomography (XMT)

2007 ◽  
Vol 84 (1-4) ◽  
pp. 321-326 ◽  
Author(s):  
A.R. Videla ◽  
C.L. Lin ◽  
J.D. Miller
Keyword(s):  
X Ray ◽  
Packed Particle ◽  
Particle Beds ◽  
Packed Particle Beds

Heat Transfer Between Gas-Solid Phases Within Packed Particle Beds

2011 ◽  
Vol 29 (2) ◽  
pp. 151-162
Author(s):  
X. D. Nie ◽  
R. W. Besant ◽  
R. W. Evitts
Keyword(s):  
Heat Transfer ◽  
Packed Particle ◽  
Solid Phases ◽  
Particle Beds ◽  
Packed Particle Beds

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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