Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique
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2020 ◽
Vol 44
(6)
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pp. 870-897
2012 ◽
Vol 2
(2)
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pp. 671-684
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2018 ◽
Vol 377
(2137)
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pp. 20180054
2011 ◽
Vol 33
(5)
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pp. 604-609
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2011 ◽
Vol 42
(1)
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pp. 1448-1450
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