Foreword to the special issue on 20th IEEE international symposium on design and diagnostics of electronic circuits and systems (DDECS2017)

Microelectronics Reliability ◽

10.1016/j.microrel.2017.12.042 ◽

2018 ◽

Vol 81 ◽

pp. 287

Author(s):

Stamenkovic Zoran ◽

Novak Ondrej ◽

Pleskacz Witold

Keyword(s):

International Symposium ◽

Electronic Circuits ◽

Special Issue ◽

Ieee International Symposium

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Guest Editorial Introduction to the Special Issue on the Eighth IEEE International Symposium on System Synthesis

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.1997.555986 ◽

1997 ◽

Vol 5 (1) ◽

pp. 57-58

Author(s):

A.A. Jerraya ◽

G. Goossens

Keyword(s):

International Symposium ◽

Guest Editorial ◽

Editorial Introduction ◽

Special Issue ◽

System Synthesis ◽

Ieee International Symposium

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Introduction to the Special Issue on the 2004 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2005.849903 ◽

2005 ◽

Vol 5 (2) ◽

pp. 167-167

Author(s):

K.L. Pey ◽

A. Trigg ◽

S. Chung

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Special Issue ◽

Ieee International Symposium

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Introduction to the Special Issue on the Joint Meeting of 12th International Meeting on Ferroelectricity and 18th IEEE International Symposium on Applications of Ferroelectrics

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control ◽

10.1109/tuffc-2010.1666 ◽

2010 ◽

Author(s):

Marija Kosec ◽

Yuji Noguchi ◽

Wei Ren ◽

Susan Trolier-McKinstry ◽

Takaaki Tsurumi

Keyword(s):

International Symposium ◽

Joint Meeting ◽

Special Issue ◽

International Meeting ◽

Ieee International Symposium

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Guest Editorial Special Issue on the 2016 IEEE International Symposium on Circuits and Systems (ISCAS 2016)

IEEE Transactions on Circuits and Systems I Regular Papers ◽

10.1109/tcsi.2016.2624238 ◽

2016 ◽

Vol 63 (12) ◽

pp. 2109-2111

Author(s):

Andrea Mazzanti ◽

Christoph Studer ◽

Filippo Neri ◽

Josep M. Olm ◽

Yichuang Sun

Keyword(s):

International Symposium ◽

Guest Editorial ◽

Special Issue ◽

Editorial Special Issue ◽

Ieee International Symposium

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Editorial: Introduction to the Special Issue for the 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity

IEEE Transactions on Electromagnetic Compatibility ◽

10.1109/temc.2020.3007298 ◽

2020 ◽

Vol 62 (4) ◽

pp. 1374-1375

Author(s):

Xiaoning Ye

Keyword(s):

International Symposium ◽

Electromagnetic Compatibility ◽

Editorial Introduction ◽

Power Integrity ◽

Special Issue ◽

Ieee International Symposium

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Guest Editorial Special Issue on the 2019 IEEE International Symposium on Circuits and Systems

IEEE Transactions on Circuits & Systems II Express Briefs ◽

10.1109/tcsii.2019.2909179 ◽

2019 ◽

Vol 66 (5) ◽

pp. 717-717

Author(s):

Jose M. De La Rosa ◽

Yoshifumi Nishio

Keyword(s):

International Symposium ◽

Guest Editorial ◽

Special Issue ◽

Editorial Special Issue ◽

Ieee International Symposium

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Guest Editorial Special Issue on the 2017 IEEE International Symposium on Circuits and Systems (ISCAS 2017)

IEEE Transactions on Circuits and Systems I Regular Papers ◽

10.1109/tcsi.2017.2788178 ◽

2018 ◽

Vol 65 (3) ◽

pp. 857-858

Author(s):

Fabio Pareschi ◽

Felix Lustenberger ◽

Hakan Johansson ◽

Joseph Cavallaro

Keyword(s):

International Symposium ◽

Guest Editorial ◽

Special Issue ◽

Editorial Special Issue ◽

Ieee International Symposium

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Introduction to the Special Issue for the 2017 IEEE International Symposium on EMC+SIPI

IEEE Transactions on Electromagnetic Compatibility ◽

10.1109/temc.2018.2795358 ◽

2018 ◽

Vol 60 (4) ◽

pp. 1036-1037

Author(s):

G. Spadacini ◽

J. Fan

Keyword(s):

International Symposium ◽

Special Issue ◽

Ieee International Symposium

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Guest Editorial Special Issue on the 2020 IEEE International Symposium on Circuits and Systems

IEEE Transactions on Circuits & Systems II Express Briefs ◽

10.1109/tcsii.2020.2984139 ◽

2020 ◽

Vol 67 (5) ◽

pp. 805-805

Author(s):

Yajun Ha ◽

Edoardo Bonizzoni

Keyword(s):

International Symposium ◽

Guest Editorial ◽

Special Issue ◽

Editorial Special Issue ◽

Ieee International Symposium

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Introduction to the Special Issue on the IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2006.877203 ◽

2006 ◽

Vol 6 (2) ◽

pp. 181-181

Author(s):

C.H. Tung ◽

J.M. Chin ◽

S. Lim

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Special Issue ◽

Ieee International Symposium

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